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Biehler, B., La Rosa, A. H. (2002) High frequency-bandwidth optical technique to measure thermal elongation time responses of near-field scanning optical microscopy probes. Review of Scientific Instruments, 73 (11). 3837-3840 doi:10.1063/1.1510548

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Reference TypeJournal (article/letter/editorial)
TitleHigh frequency-bandwidth optical technique to measure thermal elongation time responses of near-field scanning optical microscopy probes
JournalReview of Scientific Instruments
AuthorsBiehler, B.Author
La Rosa, A. H.Author
Year2002 (November)Volume73
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.1510548Search in ResearchGate
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Mindat Ref. ID4886366Long-form Identifiermindat:1:5:4886366:3
GUID0
Full ReferenceBiehler, B., La Rosa, A. H. (2002) High frequency-bandwidth optical technique to measure thermal elongation time responses of near-field scanning optical microscopy probes. Review of Scientific Instruments, 73 (11). 3837-3840 doi:10.1063/1.1510548
Plain TextBiehler, B., La Rosa, A. H. (2002) High frequency-bandwidth optical technique to measure thermal elongation time responses of near-field scanning optical microscopy probes. Review of Scientific Instruments, 73 (11). 3837-3840 doi:10.1063/1.1510548
In(2002, November) Review of Scientific Instruments Vol. 73 (11) AIP Publishing

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