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Wright, Stuart I., Singh, Saransh, De Graef, Marc (2019) Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis, 25 (3). 675-681 doi:10.1017/s1431927619000333

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Reference TypeJournal (article/letter/editorial)
TitleReflector Selection for the Indexing of Electron Backscatter Diffraction Patterns
JournalMicroscopy and Microanalysis
AuthorsWright, Stuart I.Author
Singh, SaranshAuthor
De Graef, MarcAuthor
Year2019 (June)Volume25
Issue3
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619000333Search in ResearchGate
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Mindat Ref. ID4888722Long-form Identifiermindat:1:5:4888722:9
GUID0
Full ReferenceWright, Stuart I., Singh, Saransh, De Graef, Marc (2019) Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis, 25 (3). 675-681 doi:10.1017/s1431927619000333
Plain TextWright, Stuart I., Singh, Saransh, De Graef, Marc (2019) Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis, 25 (3). 675-681 doi:10.1017/s1431927619000333
In(2019, June) Microscopy and Microanalysis Vol. 25 (3) Cambridge University Press (CUP)

See Also

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Wright, Stuart I., De Graef, Marc, Singh, Saransh (2019) Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation. Microscopy and Microanalysis, 25. 206-207 doi:10.1017/s1431927619001764
Singh, Saransh, De Graef, Marc (2017) Dictionary Indexing of Electron Channeling Patterns. Microscopy and Microanalysis, 23 (1). 1-10 doi:10.1017/s1431927616012769
Singh, Saransh, De Graef, Marc (2015) Automated Dictionary-based Indexing of Electron Channeling Patterns. Microscopy and Microanalysis, 21. 2041-2042 doi:10.1017/s1431927615010983
Singh, Saransh, De Graef, Marc (2016) Automated Data Acquisition and Indexing of Electron Channeling Patterns using the Dictionary Approach. Microscopy and Microanalysis, 22. 1420-1421 doi:10.1017/s1431927616007947
Lenthe, William, Singh, Saransh, De Graef, Marc (2019) Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns. Journal of Applied Crystallography, 52 (5). 1157-1168 doi:10.1107/s1600576719011233
Jackson, Brian E., Christensen, Jordan J., Singh, Saransh, De Graef, Marc, Fullwood, David T., Homer, Eric R., Wagoner, Robert H. (2016) Performance of Dynamically Simulated Reference Patterns for Cross-Correlation Electron Backscatter Diffraction. Microscopy and Microanalysis, 22 (4). 789-802 doi:10.1017/s143192761601148x
Singh, Saransh, Ram, Farangis, De Graef, Marc (2017) EMsoft: open source software for electron diffraction/image simulations. Microscopy and Microanalysis, 23. 212-213 doi:10.1017/s143192761700174x
Callahan, Patrick G., De Graef, Marc (2013) Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations. Microscopy and Microanalysis, 19 (5). 1255-1265 doi:10.1017/s1431927613001840
Pascal, Elena, Singh, Saransh, Ben Hourahine, , Trager-Cowan, Carol, De Graef, Marc (2017) Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns. Microscopy and Microanalysis, 23. 540-541 doi:10.1017/s1431927617003385
Chapman, Michael, Singh, Saransh, De Graef, Marc (2015) Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?. Microscopy and Microanalysis, 21. 2039-2040 doi:10.1017/s1431927615010971
Singh, Saransh, Marquardt, Katharina, De Graef, Marc (2017) Accurate Grain and Phase Boundary Location by Dictionary-based Indexing of Geological EBSD Data. Microscopy and Microanalysis, 23. 2156-2157 doi:10.1017/s1431927617011448
 
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