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Singh, Saransh, De Graef, Marc (2015) Automated Dictionary-based Indexing of Electron Channeling Patterns. Microscopy and Microanalysis, 21. 2041-2042 doi:10.1017/s1431927615010983

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Reference TypeJournal (article/letter/editorial)
TitleAutomated Dictionary-based Indexing of Electron Channeling Patterns
JournalMicroscopy and Microanalysis
AuthorsSingh, SaranshAuthor
De Graef, MarcAuthor
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615010983Search in ResearchGate
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Mindat Ref. ID4874107Long-form Identifiermindat:1:5:4874107:9
GUID0
Full ReferenceSingh, Saransh, De Graef, Marc (2015) Automated Dictionary-based Indexing of Electron Channeling Patterns. Microscopy and Microanalysis, 21. 2041-2042 doi:10.1017/s1431927615010983
Plain TextSingh, Saransh, De Graef, Marc (2015) Automated Dictionary-based Indexing of Electron Channeling Patterns. Microscopy and Microanalysis, 21. 2041-2042 doi:10.1017/s1431927615010983
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

See Also

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Singh, Saransh, De Graef, Marc (2017) Dictionary Indexing of Electron Channeling Patterns. Microscopy and Microanalysis, 23 (1). 1-10 doi:10.1017/s1431927616012769
Singh, Saransh, De Graef, Marc (2016) Automated Data Acquisition and Indexing of Electron Channeling Patterns using the Dictionary Approach. Microscopy and Microanalysis, 22. 1420-1421 doi:10.1017/s1431927616007947
Singh, Saransh, Marquardt, Katharina, De Graef, Marc (2017) Accurate Grain and Phase Boundary Location by Dictionary-based Indexing of Geological EBSD Data. Microscopy and Microanalysis, 23. 2156-2157 doi:10.1017/s1431927617011448
Wright, Stuart I., Singh, Saransh, De Graef, Marc (2019) Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis, 25 (3). 675-681 doi:10.1017/s1431927619000333
Chapman, Michael, Singh, Saransh, De Graef, Marc (2015) Can EBSD Patterns Be Used for Determination of Grain Boundary Inclination?. Microscopy and Microanalysis, 21. 2039-2040 doi:10.1017/s1431927615010971
Singh, Saransh, Graef, Marc De (2015) GPU-Based Defect Image Simulations using the Scattering Matrix Formalism. Microscopy and Microanalysis, 21. 2213-2214 doi:10.1017/s1431927615011848
Wright, Stuart I., De Graef, Marc, Singh, Saransh (2019) Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation. Microscopy and Microanalysis, 25. 206-207 doi:10.1017/s1431927619001764
Tessmer, Joseph, Singh, Saransh, Picard, Yoosuf N., DeGraef, Marc (2017) Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM. Microscopy and Microanalysis, 23. 550-551 doi:10.1017/s1431927617003439
Wang, A., Leff, A.C., Taheri, M.L., De Graef, M. (2015) A Statistical Dictionary Approach to Automated Orientation Determination from Precession Electron Diffraction Patterns. Microscopy and Microanalysis, 21. 1247-1248 doi:10.1017/s1431927615007023
Singh, Saransh, Ram, Farangis, De Graef, Marc (2017) EMsoft: open source software for electron diffraction/image simulations. Microscopy and Microanalysis, 23. 212-213 doi:10.1017/s143192761700174x
Pascal, Elena, Singh, Saransh, Ben Hourahine, , Trager-Cowan, Carol, De Graef, Marc (2017) Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns. Microscopy and Microanalysis, 23. 540-541 doi:10.1017/s1431927617003385
 
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