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Allaz, Julien M., Williams, Michael L., Jercinovic, Michael J., Goemann, Karsten, Donovan, John (2019) Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis. Microscopy and Microanalysis, 25 (1). 30-46 doi:10.1017/s1431927618015660

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Reference TypeJournal (article/letter/editorial)
TitleMultipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis
JournalMicroscopy and Microanalysis
AuthorsAllaz, Julien M.Author
Williams, Michael L.Author
Jercinovic, Michael J.Author
Goemann, KarstenAuthor
Donovan, JohnAuthor
Year2019 (February)Volume25
Issue1
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618015660Search in ResearchGate
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Mindat Ref. ID4888558Long-form Identifiermindat:1:5:4888558:6
GUID0
Full ReferenceAllaz, Julien M., Williams, Michael L., Jercinovic, Michael J., Goemann, Karsten, Donovan, John (2019) Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis. Microscopy and Microanalysis, 25 (1). 30-46 doi:10.1017/s1431927618015660
Plain TextAllaz, Julien M., Williams, Michael L., Jercinovic, Michael J., Goemann, Karsten, Donovan, John (2019) Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis. Microscopy and Microanalysis, 25 (1). 30-46 doi:10.1017/s1431927618015660
In(2019, February) Microscopy and Microanalysis Vol. 25 (1) Cambridge University Press (CUP)

See Also

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Allaz, Julien, Jercinovic, M.J., Williams, M.L., Donovan, J.J. (2014) Trace Element Analyses by EMP: Pb-in-Monazite and New Multipoint Background Method. Microscopy and Microanalysis, 20. 720-721 doi:10.1017/s1431927614005327
Jercinovic, M, Williams, M, Allaz, J, Donovan, J (2011) Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA. Microscopy and Microanalysis, 17. 576-577 doi:10.1017/s1431927611003758
Donovan, John J., Chouinard, Julie, Allaz, Julien M., von der Handt, Anette, Seward, Gareth G. E., Neill, Owen, Goemann, Karsten, Carpenter, Paul (2022) Quantitative WDS Compositional Mapping Using the Electron Microprobe. Microscopy and Microanalysis, 28. 608-610 doi:10.1017/s1431927622002987
Allaz, Julien M., Popa, Razvan-Gabriel, Reusser, Eric, Martin, Lukas (2019) Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?. Microscopy and Microanalysis, 25. 2312-2313 doi:10.1017/s1431927619012297
Jercinovic, M J, Williams, M L, Allaz, J, Donovan, J J (2012) Trace analysis in EPMA. IOP Conference Series: Materials Science and Engineering, 32. 12012pp. doi:10.1088/1757-899x/32/1/012012
Donovan, John J., Armstrong, John T. (2015) Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements. Microscopy and Microanalysis, 21. 1445-1446 doi:10.1017/s1431927615008004
Hanchar, J M, Donovan, J J (2004) An Assessment of Precision and Accuracy of Electron Microprobe Dating of Monazite. Microscopy and Microanalysis, 10. 900-901 doi:10.1017/s1431927604885994
Donovan, John J., Allaz, Julien M., von der Handt, Anette, Seward, Gareth G.E., Neill, Owen, Goemann, Karsten, Chouinard, Julie, Carpenter, Paul K. (2021) Quantitative WDS compositional mapping using the electron microprobe. American Mineralogist, 106 (11) 1717-1735 doi:10.2138/am-2021-7739
Donovan, John J., Armstrong, John T. (2014) A New EPMA Method For Fast Trace Element Analysis In Simple Matrices. Microscopy and Microanalysis, 20. 724-725 doi:10.1017/s1431927614005340
Allaz, Julien M. (2017) Testing a New Electron Microprobe and Developing New Analytical Protocols. Microscopy and Microanalysis, 23. 1052-1053 doi:10.1017/s143192761700592x
Jercinovic, Michael J., Williams, Michael L., Lane, Edward D. (2008) In-situ trace element analysis of monazite and other fine-grained accessory minerals by EPMA. Chemical Geology, 254 (3) 197-215 doi:10.1016/j.chemgeo.2008.05.016
 
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