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Donovan, John J., Armstrong, John T. (2014) A New EPMA Method For Fast Trace Element Analysis In Simple Matrices. Microscopy and Microanalysis, 20. 724-725 doi:10.1017/s1431927614005340

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Reference TypeJournal (article/letter/editorial)
TitleA New EPMA Method For Fast Trace Element Analysis In Simple Matrices
JournalMicroscopy and Microanalysis
AuthorsDonovan, John J.Author
Armstrong, John T.Author
Year2014 (August)Volume20
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927614005340Search in ResearchGate
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Mindat Ref. ID4867390Long-form Identifiermindat:1:5:4867390:9
GUID0
Full ReferenceDonovan, John J., Armstrong, John T. (2014) A New EPMA Method For Fast Trace Element Analysis In Simple Matrices. Microscopy and Microanalysis, 20. 724-725 doi:10.1017/s1431927614005340
Plain TextDonovan, John J., Armstrong, John T. (2014) A New EPMA Method For Fast Trace Element Analysis In Simple Matrices. Microscopy and Microanalysis, 20. 724-725 doi:10.1017/s1431927614005340
In(2014) Microscopy and Microanalysis Vol. 20. Cambridge University Press (CUP)

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Donovan, John J., Singer, Jared W., Armstrong, John T. (2016) A new EPMA method for fast trace element analysis in simple matrices. American Mineralogist, 101 (8) 1839-1853 doi:10.2138/am-2016-5628
Donovan, John J., Armstrong, John T. (2015) Improving Trace Element Analysis Precision By Not Using Off-Peak Measurements. Microscopy and Microanalysis, 21. 1445-1446 doi:10.1017/s1431927615008004
Armstrong, John T., Donovan, John J. (2014) What's Still Missing with the Fluorescence Corrections and Should We Care?. Microscopy and Microanalysis, 20. 726-727 doi:10.1017/s1431927614005352
Jercinovic, M, Williams, M, Allaz, J, Donovan, J (2011) Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA. Microscopy and Microanalysis, 17. 576-577 doi:10.1017/s1431927611003758
McSwiggen, Peter, Armstrong, John T., Nielsen, Charles (2014) Strategies for Low Accelerating Voltage X-ray Microanalysis of Sub-Micrometer Features with the FE-EPMA. Microscopy and Microanalysis, 20. 688-689 doi:10.1017/s1431927614005169
Allaz, Julien, Jercinovic, M.J., Williams, M.L., Donovan, J.J. (2014) Trace Element Analyses by EMP: Pb-in-Monazite and New Multipoint Background Method. Microscopy and Microanalysis, 20. 720-721 doi:10.1017/s1431927614005327
Donovan, John J (2004) Fast and Easy Background Modeling For Practical Quantitative Analysis. Microscopy and Microanalysis, 10. 896-897 doi:10.1017/s1431927604880553
Armstrong, J. T., Marinenko, R. B., Davis, J. M. (2002) A Simple Method For Determining Optimum Corrections For High-Accuracy Epma In Difficult Chemical Systems. Microscopy and Microanalysis, 8. 438-439 doi:10.1017/s1431927602101012
Allaz, Julien M., Williams, Michael L., Jercinovic, Michael J., Goemann, Karsten, Donovan, John (2019) Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis. Microscopy and Microanalysis, 25 (1). 30-46 doi:10.1017/s1431927618015660
Carpenter, P. K., Jolliff, B. L., Donovan, J. J. (2014) Compositional Mapping by EPMA and µXRF. Microscopy and Microanalysis, 20. 710-711 doi:10.1017/s1431927614005273
Armstrong, John T. (2014) Comparative Performance of SDD-EDS and WDS Detectors for Quantitative Analysis of Mineral Specimens: The Next Generation Electron Microprobe. Microscopy and Microanalysis, 20. 692-693 doi:10.1017/s1431927614005182
 
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