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Addiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2019) Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 18-19 doi:10.1017/s1431927619000825

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Reference TypeJournal (article/letter/editorial)
TitleCharge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsAddiego, ChristopherAuthor
Gao, WenpeiAuthor
Pan, XiaoqingAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619000825Search in ResearchGate
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Mindat Ref. ID4885632Long-form Identifiermindat:1:5:4885632:6
GUID0
Full ReferenceAddiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2019) Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 18-19 doi:10.1017/s1431927619000825
Plain TextAddiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2019) Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 18-19 doi:10.1017/s1431927619000825
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Addiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2020) Polarization in Ferroelectric BiFeO3 Imaged in 3D Using Four-dimensional Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 26. 1132-1134 doi:10.1017/s1431927620017043
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Addiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2020) Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction. Ultramicroscopy, 208. 112850pp. doi:10.1016/j.ultramic.2019.112850
Gao, Wenpei, Addiego, Christopher, Ma, Yanling, Wu, Jianbo, Pan, Xiaoqing (2018) Combined In Situ and Ex Situ Study on Synthesis of Nanostructured Catalyst in Solid State. Microscopy and Microanalysis, 24. 288-289 doi:10.1017/s1431927618001939
Spiecker, Erdmann, Dolle, Christian, Schweizer, Peter, Denninger, Peter (2019) Scanning Transmission Electron Microscopy and Diffraction in SEM: Novel Approaches for In Situ Studies. Microscopy and Microanalysis, 25. 25-26 doi:10.1017/s1431927618015866
Ophus, Colin (2019) Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond. Microscopy and Microanalysis, 25 (3). 563-582 doi:10.1017/s1431927619000497
Shibata, N. (2019) Differential Phase Contrast Scanning Transmission Electron Microscopy at Atomic Resolution. Microscopy and Microanalysis, 25. 14-15 doi:10.1017/s1431927619000801
 
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