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Gao, Wenpei, Addiego, Chris, Huyan, Huaixun, Pan, Xiaoqing (2019) Measuring Charge State at the Single-Atomic-Column-Base with Four-Dimensional Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 16-17 doi:10.1017/s1431927619000813

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Reference TypeJournal (article/letter/editorial)
TitleMeasuring Charge State at the Single-Atomic-Column-Base with Four-Dimensional Scanning Transmission Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsGao, WenpeiAuthor
Addiego, ChrisAuthor
Huyan, HuaixunAuthor
Pan, XiaoqingAuthor
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619000813Search in ResearchGate
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Mindat Ref. ID4885629Long-form Identifiermindat:1:5:4885629:2
GUID0
Full ReferenceGao, Wenpei, Addiego, Chris, Huyan, Huaixun, Pan, Xiaoqing (2019) Measuring Charge State at the Single-Atomic-Column-Base with Four-Dimensional Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 16-17 doi:10.1017/s1431927619000813
Plain TextGao, Wenpei, Addiego, Chris, Huyan, Huaixun, Pan, Xiaoqing (2019) Measuring Charge State at the Single-Atomic-Column-Base with Four-Dimensional Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 16-17 doi:10.1017/s1431927619000813
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Addiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2019) Charge Density Mapping via Scanning Diffraction in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 25. 18-19 doi:10.1017/s1431927619000825
Huyan, Huaixun, Addiego, Christopher, Gao, Wenpei, Li, Linze, Heikes, Colin, Schlom, Darrel, Pan, Xiaoqing (2020) Observation of Charge Separation along BiFeO3 109° Domain Walls by Using Low-convergence Angle 4-Dimensional Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 26. 234-235 doi:10.1017/s1431927620013902
Addiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2020) Polarization in Ferroelectric BiFeO3 Imaged in 3D Using Four-dimensional Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 26. 1132-1134 doi:10.1017/s1431927620017043
Huyan, Huaixun, Addiego, Christopher, Heikes, Colin, Schlom, Darrell, Pan, Xiaoqing (2021) Direct observation of polarization-induced two-dimensional electron/hole gases at ferroelectric-insulator interface. Microscopy and Microanalysis, 27. 712-713 doi:10.1017/s1431927621002907
Dai, Sheng, Yan, Xingxu, Gao, Wenpei, Tieu, Peter, Graham, George W., Pan, Xiaoqing (2019) Transmission Electron Microscopy of Catalytic Nanomaterials at Atomic Resolution. Microscopy and Microanalysis, 25. 2054-2055 doi:10.1017/s1431927619011000
Gao, Wenpei, Addiego, Christopher, Wang, Hui, Yan, Xingxu, Hou, Yusheng, Ji, Dianxiang, Heikes, Colin, Zhang, Yi, Li, Linze, Huyan, Huaixun, Blum, Thomas, Aoki, Toshihiro, Nie, Yuefeng, Schlom, Darrell G., Wu, Ruqian, Pan, Xiaoqing (2019) Real-space charge-density imaging with sub-ångström resolution by four-dimensional electron microscopy. Nature, 575 (7783). 480-484 doi:10.1038/s41586-019-1649-6
Wang, Xiaowang, Gadre, Chaitanya, Addiego, Christopher, Huyan, Huaixun, Xu, Mingjie, Yan, Xingxu, Pan, Xiaoqing (2022) Exploring the Atomic Scale Structure and Properties of Grain Boundary in SrTiO3 by Electron Beam Imaging and Spectroscopy. Microscopy and Microanalysis, 28. 2408-2409 doi:10.1017/s1431927622009229
Huyan, Huaixun, Li, Linze, Zhang, Yi, Heikes, Colin, Schlom, Darrel, Pan, Xiaoqing (2019) Observation of Dislocation-Assisted 2-Dimensional Conductive Channels Embedded in Perovskite Thin Films. Microscopy and Microanalysis, 25. 2410-2411 doi:10.1017/s1431927619012789
Addiego, Christopher, Gao, Wenpei, Pan, Xiaoqing (2020) Multiscale Electric Field Imaging of Vortices in PbTiO3-SrTiO3 Superlattice. Microscopy and Microanalysis, 26. 466-468 doi:10.1017/s1431927620014750
Gao, Wenpei, Addiego, Christopher, Pan, Xiaoqing (2017) Calculation of the Electric Field Based on Average Momentum Transfer Using Pixelated Electron Detector in STEM. Microscopy and Microanalysis, 23. 2104-2105 doi:10.1017/s1431927617011187
Ophus, Colin (2019) Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond. Microscopy and Microanalysis, 25 (3). 563-582 doi:10.1017/s1431927619000497
 
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