Volkenandt, Tobias, Müller, Erich, Gerthsen, Dagmar (2014) Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies. Microscopy and Microanalysis, 20 (1). 111-123 doi:10.1017/s1431927613013913
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Volkenandt, Tobias | Author | |
| Müller, Erich | Author | ||
| Gerthsen, Dagmar | Author | ||
| Year | 2014 (February) | Volume | 20 |
| Issue | 1 | ||
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927613013913Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4869847 | Long-form Identifier | mindat:1:5:4869847:6 |
| GUID | 0 | ||
| Full Reference | Volkenandt, Tobias, Müller, Erich, Gerthsen, Dagmar (2014) Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies. Microscopy and Microanalysis, 20 (1). 111-123 doi:10.1017/s1431927613013913 | ||
| Plain Text | Volkenandt, Tobias, Müller, Erich, Gerthsen, Dagmar (2014) Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies. Microscopy and Microanalysis, 20 (1). 111-123 doi:10.1017/s1431927613013913 | ||
| In | (2014, February) Microscopy and Microanalysis Vol. 20 (1) Cambridge University Press (CUP) | ||
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