登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Volkenandt, T., Müller, E., Gerthsen, D. (2014) Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies. Microscopy and Microanalysis, 20. 142-143 doi:10.1017/s1431927614002438

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleSample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies
JournalMicroscopy and Microanalysis
AuthorsVolkenandt, T.Author
Müller, E.Author
Gerthsen, D.Author
Year2014 (August)Volume20
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927614002438Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4866464Long-form Identifiermindat:1:5:4866464:6
GUID0
Full ReferenceVolkenandt, T., Müller, E., Gerthsen, D. (2014) Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies. Microscopy and Microanalysis, 20. 142-143 doi:10.1017/s1431927614002438
Plain TextVolkenandt, T., Müller, E., Gerthsen, D. (2014) Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies. Microscopy and Microanalysis, 20. 142-143 doi:10.1017/s1431927614002438
In(2014) Microscopy and Microanalysis Vol. 20. Cambridge University Press (CUP)

See Also

These are possibly similar items as determined by title/reference text matching only.

Volkenandt, Tobias, Müller, Erich, Gerthsen, Dagmar (2014) Sample Thickness Determination by Scanning Transmission Electron Microscopy at Low Electron Energies. Microscopy and Microanalysis, 20 (1). 111-123 doi:10.1017/s1431927613013913
Volkenandt, T., Müller, E., Hu, D.Z., Schaadt, D.M., Gerthsen, D. (2010) Quantification of Sample Thickness and In-Concentration of InGaAs Quantum Wells by Transmission Measurements in a Scanning Electron Microscope. Microscopy and Microanalysis, 16 (5). 604-613 doi:10.1017/s1431927610000292
Müller, E, Volkenandt, T, Hu, DZ, Schaadt, DM, Gerthsen, D (2010) Quantitative Analysis by Electron Transmission Measurements in a Scanning Electron Microscope. Microscopy and Microanalysis, 16. 612-613 doi:10.1017/s1431927610056151
Hugenschmidt, Milena, Müller, Erich, Gerthsen, Dagmar (2019) Beam Broadening Measured in Transmission Mode at Low Electron Energies in a Scanning Electron Microscope. Microscopy and Microanalysis, 25. 478-479 doi:10.1017/s143192761900312x
Pfaff, M., Müller, E., Müller, P., Gerthsen, D., Klein, M.G., Colsmann, A., Lemmer, U. (2012) Nanomorphology of P3HT:PCBM-based Organic Solar Cells Analyzed by Low-Energy Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 18. 1234-1235 doi:10.1017/s1431927612008021
PFAFF, M., MÜLLER, E., KLEIN, M. F. G., COLSMANN, A., LEMMER, U., KRZYZANEK, V., REICHELT, R., GERTHSEN, D. (2011) Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination. Journal of Microscopy, 243 (1). 31-39 doi:10.1111/j.1365-2818.2010.03475.x
Sun, Cheng, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar (2018) On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope. Microscopy and Microanalysis, 24 (2). 99-106 doi:10.1017/s1431927618000181
Pfaff, M, Müller, E, Klein, MFG, Colsmann, A, Lemmer, U, Gerthsen, D (2010) Low-Energy Scanning Electron Transmission Measurements of Thin Polymer Films Employed in Organic Solar Cells. Microscopy and Microanalysis, 16. 1382-1383 doi:10.1017/s143192761005614x
Čalkovský, Martin, Hugenschmidt, Milena, Müller, Erich, Gerthsen, Dagmar (2019) Differential Electron Scattering Cross-Section at Low Electron Energies: The Influence of the Screening Parameter. Microscopy and Microanalysis, 25. 464-465 doi:10.1017/s1431927619003052
Patel, Binay, Watanabe, Masashi (2014) An Inexpensive Approach for Bright-Field and Dark-Field Imaging by Scanning Transmission Electron Microscopy in Scanning Electron Microscopy. Microscopy and Microanalysis, 20 (1). 124-132 doi:10.1017/s1431927613014049
Dries, Manuel, Hettler, Simon, Gamm, Björn, Müller, Erich, Send, Winfried, Gerthsen, Dagmar, Müller, Knut, Rosenauer, Andreas (2014) A Nanocrystalline Hilbert Phase-Plate for Phase-Contrast Transmission Electron Microscopy. Microscopy and Microanalysis, 20. 236-237 doi:10.1017/s1431927614002906
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.7 05:19:04
Go to top of page