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Kikuta, Hisao, Nasu, Kosuke, Kato, Nobuhiro, Iwata, Koichi (1995) Atomic force microscope using optical heterodyne detection incorporated in an optical microscope. Review of Scientific Instruments, 66 (1). 87-90 doi:10.1063/1.1146192

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Reference TypeJournal (article/letter/editorial)
TitleAtomic force microscope using optical heterodyne detection incorporated in an optical microscope
JournalReview of Scientific Instruments
AuthorsKikuta, HisaoAuthor
Nasu, KosukeAuthor
Kato, NobuhiroAuthor
Iwata, KoichiAuthor
Year1995 (January)Volume66
Issue1
PublisherAIP Publishing
DOIdoi:10.1063/1.1146192Search in ResearchGate
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Mindat Ref. ID4868705Long-form Identifiermindat:1:5:4868705:4
GUID0
Full ReferenceKikuta, Hisao, Nasu, Kosuke, Kato, Nobuhiro, Iwata, Koichi (1995) Atomic force microscope using optical heterodyne detection incorporated in an optical microscope. Review of Scientific Instruments, 66 (1). 87-90 doi:10.1063/1.1146192
Plain TextKikuta, Hisao, Nasu, Kosuke, Kato, Nobuhiro, Iwata, Koichi (1995) Atomic force microscope using optical heterodyne detection incorporated in an optical microscope. Review of Scientific Instruments, 66 (1). 87-90 doi:10.1063/1.1146192
In(1995, January) Review of Scientific Instruments Vol. 66 (1) AIP Publishing

See Also

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Kato, Nobuhiro, Suzuki, Ippei, Kikuta, Hisao, Iwata, Koichi (1995) Force‐balancing force sensor with an optical lever. Review of Scientific Instruments, 66 (12). 5532-5536 doi:10.1063/1.1146080
Kato, Nobuhiro, Suzuki, Ippei, Kikuta, Hisao, Iwata, Koichi (1997) Force-balancing microforce sensor with an optical-fiber interferometer. Review of Scientific Instruments, 68 (6). 2475-2478 doi:10.1063/1.1148171
Kato, Nobuhiro, Matsumoto, Toshiro, Kikuta, Hisao, Nakamura, Yasuhiro, Iwata, Koichi (2001) Reduction in Feedback Bandwidth of the Force-Controlled Atomic Force Microscope Using a Polyimide Cantilever. Japanese Journal of Applied Physics, 40. 6594-6599 doi:10.1143/jjap.40.6594
Kato, Nobuhiro, Kikuta, Hisao, Nakano, Takashi, Matsumoto, Toshiro, Iwata, Koichi (1999) System analysis of the force-feedback method for force curve measurements. Review of Scientific Instruments, 70 (5). 2402-2407 doi:10.1063/1.1149768
Kikuta, Hisao, Asai, Shigeki, Yasukochi, Hiroyuki, Iwata, Koichi (1991) Force Microscopy Using Common-Path Optical-Heterodyne Interferometer. Japanese Journal of Applied Physics, 30. 587-590 doi:10.1143/jjap.30.587
Markiewicz, Peter, Goh, M. Cynthia (1995) Atomic force microscope tip deconvolution using calibration arrays. Review of Scientific Instruments, 66 (5). 3186-3190 doi:10.1063/1.1145549
Fu, Joseph (1995) In situ testing and calibrating of z‐piezo of an atomic force microscope. Review of Scientific Instruments, 66 (7). 3785-3788 doi:10.1063/1.1145438
Fann, Wunshain (1995) Simple transmission mode near‐field optical microscope. Review of Scientific Instruments, 66 (1). 271-272 doi:10.1063/1.1145273
Mou, Jianxun, Yang, Jie, Shao, Zhifeng (1993) An optical detection low temperature atomic force microscope at ambient pressure for biological research. Review of Scientific Instruments, 64 (6). 1483-1488 doi:10.1063/1.1144454
Yakimov, V., Erlandsson, R. (2000) Electrostatic force-feedback force sensor incorporated in an ultrahigh vacuum force microscope. Review of Scientific Instruments, 71 (1). 133-136 doi:10.1063/1.1150147
Reitsma, M. G. (2007) Lateral force microscope calibration using a modified atomic force microscope cantilever. Review of Scientific Instruments, 78 (10). 106102pp. doi:10.1063/1.2789653
 
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