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Reitsma, M. G. (2007) Lateral force microscope calibration using a modified atomic force microscope cantilever. Review of Scientific Instruments, 78 (10). 106102pp. doi:10.1063/1.2789653

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Reference TypeJournal (article/letter/editorial)
TitleLateral force microscope calibration using a modified atomic force microscope cantilever
JournalReview of Scientific Instruments
AuthorsReitsma, M. G.Author
Year2007 (October)Volume78
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.2789653Search in ResearchGate
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Mindat Ref. ID4897008Long-form Identifiermindat:1:5:4897008:8
GUID0
Full ReferenceReitsma, M. G. (2007) Lateral force microscope calibration using a modified atomic force microscope cantilever. Review of Scientific Instruments, 78 (10). 106102pp. doi:10.1063/1.2789653
Plain TextReitsma, M. G. (2007) Lateral force microscope calibration using a modified atomic force microscope cantilever. Review of Scientific Instruments, 78 (10). 106102pp. doi:10.1063/1.2789653
In(2007, October) Review of Scientific Instruments Vol. 78 (10) AIP Publishing

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Gates, Richard S., Reitsma, Mark G. (2007) Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array. Review of Scientific Instruments, 78 (8). 86101pp. doi:10.1063/1.2764372
Chung, Koo-Hyun, Reitsma, Mark G. (2010) Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers. Review of Scientific Instruments, 81 (2). 26104pp. doi:10.1063/1.3276709
Lefever, Joel A.; Labuda, Aleksander; Proksch, Roger (2026) Lateral force microscopy calibration using an interferometric atomic force microscope. Review of Scientific Instruments, 97 (4). doi:10.1063/5.0318278
Aksu, Saltuk B., Turner, Joseph A. (2007) Calibration of atomic force microscope cantilevers using piezolevers. Review of Scientific Instruments, 78 (4). 43704pp. doi:10.1063/1.2719649
Barkley, Sarice S., Deng, Zhao, Gates, Richard S., Reitsma, Mark G., Cannara, Rachel J. (2012) Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope. Review of Scientific Instruments, 83 (2). 23707pp. doi:10.1063/1.3685243
Cain, Robert G., Reitsma, Mark G., Biggs, Simon, Page, Neil W. (2001) Quantitative comparison of three calibration techniques for the lateral force microscope. Review of Scientific Instruments, 72 (8). 3304-3312 doi:10.1063/1.1386631
Park, Keunhan, Lee, Jungchul, Zhang, Zhuomin M., King, William P. (2007) Topography imaging with a heated atomic force microscope cantilever in tapping mode. Review of Scientific Instruments, 78 (4). 43709pp. doi:10.1063/1.2721422
Li, Q., Kim, K.-S., Rydberg, A. (2006) Lateral force calibration of an atomic force microscope with a diamagnetic levitation spring system. Review of Scientific Instruments, 77 (6). 65105pp. doi:10.1063/1.2209953
Markiewicz, Peter, Goh, M. Cynthia (1995) Atomic force microscope tip deconvolution using calibration arrays. Review of Scientific Instruments, 66 (5). 3186-3190 doi:10.1063/1.1145549
Lievonen, J., Ranttila, K., Ahlskog, M. (2007) Environmental chamber for an atomic force microscope. Review of Scientific Instruments, 78 (4). 43703pp. doi:10.1063/1.2719598
Baselt, David R., Baldeschwieler, John D. (1993) Scanned‐cantilever atomic force microscope. Review of Scientific Instruments, 64 (4). 908-911 doi:10.1063/1.1144142
 
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