| Reference Type | Journal (article/letter/editorial) |
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| Title | Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale |
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| Journal | Microscopy and Microanalysis |
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| Authors | Odlyzko, Michael L. | Author |
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| Andre Mkhoyan, K. | Author |
| Year | 2014 (August) | Volume | 20 |
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| Publisher | Cambridge University Press (CUP) |
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| DOI | doi:10.1017/s1431927614002451Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 4866473 | Long-form Identifier | mindat:1:5:4866473:4 |
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| GUID | 0 |
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| Full Reference | Odlyzko, Michael L., Andre Mkhoyan, K. (2014) Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale. Microscopy and Microanalysis, 20. 146-147 doi:10.1017/s1431927614002451 |
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| Plain Text | Odlyzko, Michael L., Andre Mkhoyan, K. (2014) Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale. Microscopy and Microanalysis, 20. 146-147 doi:10.1017/s1431927614002451 |
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| In | (2014) Microscopy and Microanalysis Vol. 20. Cambridge University Press (CUP) |
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These are possibly similar items as determined by title/reference text matching only.
