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Odlyzko, Michael L., Mkhoyan, K. Andre (2012) Identifying Hexagonal Boron Nitride Monolayers by Transmission Electron Microscopy. Microscopy and Microanalysis, 18 (3). 558-567 doi:10.1017/s143192761200013x

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Reference TypeJournal (article/letter/editorial)
TitleIdentifying Hexagonal Boron Nitride Monolayers by Transmission Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsOdlyzko, Michael L.Author
Mkhoyan, K. AndreAuthor
Year2012 (June)Volume18
Issue3
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s143192761200013xSearch in ResearchGate
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Mindat Ref. ID4861264Long-form Identifiermindat:1:5:4861264:3
GUID0
Full ReferenceOdlyzko, Michael L., Mkhoyan, K. Andre (2012) Identifying Hexagonal Boron Nitride Monolayers by Transmission Electron Microscopy. Microscopy and Microanalysis, 18 (3). 558-567 doi:10.1017/s143192761200013x
Plain TextOdlyzko, Michael L., Mkhoyan, K. Andre (2012) Identifying Hexagonal Boron Nitride Monolayers by Transmission Electron Microscopy. Microscopy and Microanalysis, 18 (3). 558-567 doi:10.1017/s143192761200013x
In(2012, June) Microscopy and Microanalysis Vol. 18 (3) Cambridge University Press (CUP)

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Wu, Ryan J., Mittal, Anudha, Odlyzko, Michael L., Mkhoyan, K. Andre (2017) Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM). Microscopy and Microanalysis, 23 (4). 794-808 doi:10.1017/s143192761700068x
Odlyzko, M, Mkhoyan, K (2011) TEM Simulations of Tilted Atomically Thin Hexagonal Boron Nitride Sheets. Microscopy and Microanalysis, 17. 1460-1461 doi:10.1017/s1431927611008178
Wu, Ryan J., Mittal, Anudha, Odlyzko, Michael L., Mkhoyan, K. Andre (2017) Simplifying Electron Beam Channeling in STEM. Microscopy and Microanalysis, 23. 410-411 doi:10.1017/s1431927617002732
Kumar, Prashant, Odlyzko, Michael L., Rangnekar, Neel, Tsapatsis, Michael, Andre Mkhoyan, K. (2015) Structural Rearrangement of 2-D Zeolite Nanosheets under Electron Beam. Microscopy and Microanalysis, 21. 1323-1324 doi:10.1017/s1431927615007400
Odlyzko, Michael L., Andre Mkhoyan, K. (2014) Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale. Microscopy and Microanalysis, 20. 146-147 doi:10.1017/s1431927614002451
Odlyzko, Michael, Andre Mkhoyan, K. (2014) Including Thermal Vibrations and Bonding in HAADF-STEM Image Simulation. Microscopy and Microanalysis, 20. 154-155 doi:10.1017/s1431927614002499
Wu, Ryan J., Odlyzko, Michael L., Mkhoyan, K. Andre (2016) Challenges of Oversimplifying Z-contrast in Atomic Resolution ADF-STEM. Microscopy and Microanalysis, 22. 946-947 doi:10.1017/s1431927616005572
Wu, Ryan J., Odlyzko, Michael L., Andre Mkhoyan, K. (2014) Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM. Microscopy and Microanalysis, 20. 1796-1797 doi:10.1017/s143192761401071x
Odlyzko, Michael, Held, Jacob, Andre Mkhoyan, K. (2015) Chemical Bonding Effects in HAADF-STEM Imaging of Light-Element Ceramics. Microscopy and Microanalysis, 21. 121-122 doi:10.1017/s1431927615001403
Seok Jeong, Jong, Odlyzko, Michael L., Xu, Peng, Jalan, Bharat, Andre Mkhoyan, K. (2014) Interfaces and Defects in Hybrid Molecular Beam Epitaxy Grown NdTiO3/SrTiO3 Heterostructures. Microscopy and Microanalysis, 20. 98-99 doi:10.1017/s1431927614002219
Jeong, Jong Seok, Odlyzko, Michael L., Xu, Peng, Jalan, Bharat, Mkhoyan, K. Andre (2016) Probing core-electron orbitals by scanning transmission electron microscopy and measuring the delocalization of core-level excitations. Physical Review B, 93 (16) doi:10.1103/physrevb.93.165140
 
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