Iijima, S (2005) High Resolution Electron Microscopy of Carbonaceous Materials. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510110

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Reference Type	Journal (article/letter/editorial)
Title	High Resolution Electron Microscopy of Carbonaceous Materials
Journal	Microscopy and Microanalysis
Authors	Iijima, S		Author
Year	2005 (August)	Volume	11
Publisher	Cambridge University Press (CUP)
DOI	doi:10.1017/s1431927605510110Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4831379	Long-form Identifier	mindat:1:5:4831379:7
GUID	0
Full Reference	Iijima, S (2005) High Resolution Electron Microscopy of Carbonaceous Materials. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510110
Plain Text	Iijima, S (2005) High Resolution Electron Microscopy of Carbonaceous Materials. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510110
In	(2005) Microscopy and Microanalysis Vol. 11. Cambridge University Press (CUP)

	*Boothroyd, C B (2005) Phonon Scattering in High-Resolution Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605505038*
	*Verkade, P (2005) Correlative Light and Electron Microscopy with High Time Resolution and Ultrastructural Preservation. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605503209*
	*Gajdardziska-Josifovska, M, Lazarov, V K (2005) High Resolution Electron Microscopy Studies of Polar Oxide Interfaces. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509668*
	*Vane, R, Carlino, V (2005) Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501661*
	Nakagawa, M, Takeuchi, S, Muto, A, Ogashiwa, T, White, S, Sato, M (2005) A Study of Beam Sensitive Materials Using High Resolution, ULV Scanning Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501156
	*Iijima, Sumio (1980) High resolution electron microscopy of some carbonaceous materials. Journal of Microscopy, 119 (1). 99-111 doi:10.1111/j.1365-2818.1980.tb04081.x*
	*Smith, D J (2005) Progress and Perspectives for Atomic-Resolution Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510407*
	*El-Dasher, B S, Rollett, A D (2005) Defining Electron Backscatter Diffraction Resolution. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501582*
	*Chiu, W (2005) Electron Cryomicroscopy of Cellular Machines at Subnanometer Resolution. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509723*
	*Iijima, S (2005) The Role of Catalytic Nano-particles in Nano-Carbon Technology. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510171*
	*Barnard, D, Wagenknecht, T (2005) Pneumatic Micro-Sprayer for Millisecond Time Resolution in Cryo-Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s143192760550597x*

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Iijima, S (2005) High Resolution Electron Microscopy of Carbonaceous Materials. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510110

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