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Vane, R, Carlino, V (2005) Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501661

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Reference TypeJournal (article/letter/editorial)
TitleEnvironmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsVane, RAuthor
Carlino, VAuthor
Year2005 (August)Volume11
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927605501661Search in ResearchGate
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Mindat Ref. ID4828056Long-form Identifiermindat:1:5:4828056:9
GUID0
Full ReferenceVane, R, Carlino, V (2005) Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501661
Plain TextVane, R, Carlino, V (2005) Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501661
In(2005) Microscopy and Microanalysis Vol. 11. Cambridge University Press (CUP)

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Vane, Ronald, Carlino, Vince (2006) Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy. Microscopy Today, 14 (4). 62-63 doi:10.1017/s155192950005032x
Garcia, R, Batchelor, A, Mooney, C, Bunker, K, Griffis, D, Carlino, V, Vane, R, Russell, P (2005) A Study of the Cleaning Effectiveness of the Evactron(R) RF Plasma System on a Scanning Electron Microscope. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605507980
Kenik, E A, Meyer, H M, Vane, R, Carlino, V (2005) Effects of Evactron Plasma Cleaning on X-ray Detector Windows. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605506135
Boothroyd, C B (2005) Phonon Scattering in High-Resolution Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605505038
Iijima, S (2005) High Resolution Electron Microscopy of Carbonaceous Materials. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510110
Gajdardziska-Josifovska, M, Lazarov, V K (2005) High Resolution Electron Microscopy Studies of Polar Oxide Interfaces. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509668
Verkade, P (2005) Correlative Light and Electron Microscopy with High Time Resolution and Ultrastructural Preservation. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605503209
Toth, M, Lobo, C, Knowles, R, Phillips, M, Postek, M, Vladar, A (2007) Nanostructure Fabrication by Ultra-high Resolution Environmental Scanning Electron Microscopy. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607075617
Dobberstein, H, Homsy, O A, Morrison, D E, Thiel, B L (2005) Environmental Scanning Electron Microscopy in Transmission Mode. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605507128
Dobberstein, H, Purser, N J, Fairhead, T W, Stokes, D J, Knowles, R W (2005) Beam Blanking Studies in Environmental Scanning Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605507748
Nakagawa, M, Takeuchi, S, Muto, A, Ogashiwa, T, White, S, Sato, M (2005) A Study of Beam Sensitive Materials Using High Resolution, ULV Scanning Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501156
 
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