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Buras, B., Niimura, N., Olsen, J. S. (1978) Optimum resolution in X-ray energy-dispersive diffractometry. Journal of Applied Crystallography, 11 (2) 137-140 doi:10.1107/s002188987801290x

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Reference TypeJournal (article/letter/editorial)
TitleOptimum resolution in X-ray energy-dispersive diffractometry
JournalJournal of Applied Crystallography
AuthorsBuras, B.Author
Niimura, N.Author
Olsen, J. S.Author
Year1978 (April 1)Volume11
Issue2
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s002188987801290xSearch in ResearchGate
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Mindat Ref. ID466735Long-form Identifiermindat:1:5:466735:7
GUID0
Full ReferenceBuras, B., Niimura, N., Olsen, J. S. (1978) Optimum resolution in X-ray energy-dispersive diffractometry. Journal of Applied Crystallography, 11 (2) 137-140 doi:10.1107/s002188987801290x
Plain TextBuras, B., Niimura, N., Olsen, J. S. (1978) Optimum resolution in X-ray energy-dispersive diffractometry. Journal of Applied Crystallography, 11 (2) 137-140 doi:10.1107/s002188987801290x
In(1978, April) Journal of Applied Crystallography Vol. 11 (2) International Union of Crystallography (IUCr)

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Buras, B., Olsen, J. S., Gerward, L., Will, G., Hinze, E. (1977) X-ray energy-dispersive diffractometry using synchrotron radiation. Journal of Applied Crystallography, 10 (6) 431-438 doi:10.1107/s0021889877013910
Olsen, J. S., Buras, B., Jensen, T., Alstrup, O., Gerward, L., Selsmark, B. (1978) Influence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry. Acta Crystallographica Section A, 34 (1) 84-87 doi:10.1107/s0567739478014515
Staun Olsen, J., Buras, B., Steenstrup, J., Gerward, L. (1981) An X-ray energy-dispersive diffractometer for synchrotron radiation. Acta Crystallographica Section A Foundations of Crystallography, 37. doi:10.1107/s0108767381090429
Buras, B., Olsen, J.Staun, Gerward, L. (1978) White beam, X-ray, energy-dispersive diffractometry using synchrotron radiation. Nuclear Instruments and Methods, 152 (1). 293-296 doi:10.1016/0029-554x(78)90282-3
Buras, B., Staun Olsen, J., Gerward, L. (1976) X-ray energy-dispersive powder diffractometry using synchrotron radiation. Nuclear Instruments and Methods, 135 (1). 193-195 doi:10.1016/0029-554x(76)90845-4
Buras, B., Olsen, J. S., Gerward, L., Selsmark, B., Andersen, A. L. (1975) Energy-dispersive spectroscopic methods applied to X-ray diffraction in single crystals. Acta Crystallographica Section A, 31 (3) 327-333 doi:10.1107/s0567739475000691
Buras, B., Olsen, J. S., Andersen, A. L., Gerward, L., Selsmark, B. (1974) Evidence of escape peaks caused by a Si(Li) detector in energy-dispersive diffraction spectra. Journal of Applied Crystallography, 7 (2) 296-297 doi:10.1107/s0021889874009587
Buras, B., Gerward, L., Glazer, A. M., Hidaka, M., Staun Olsen, J. (1979) Quantitative structural studies by means of the energy-dispersive method with X-rays from a storage ring. Journal of Applied Crystallography, 12 (6) 531-536 doi:10.1107/s0021889879013212
Iijima, T., Nishikawa, K. (1988) X-ray inelastic scattering intensities measured by energy-dispersive diffractometry. Journal of Applied Crystallography, 21 (6). 943-948 doi:10.1107/s0021889888008131
Uno, R., Ishigaki, J. (1984) Determination of the spectral intensity distribution of the incident beam in energy-dispersive X-ray diffractometry. Journal of Applied Crystallography, 17 (3) 154-158 doi:10.1107/s0021889884011225
Cousins, C. S. G., Gerward, L., Staun Olsen, J., Selsmark, B., Sheldon, B. J. (1982) Determination of internal strain tensors by energy-dispersive X-ray diffraction: Results for Si using the 006 forbidden reflection. Journal of Applied Crystallography, 15 (2) 154-159 doi:10.1107/s0021889882011704
 
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