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Olsen, J. S., Buras, B., Jensen, T., Alstrup, O., Gerward, L., Selsmark, B. (1978) Influence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry. Acta Crystallographica Section A, 34 (1) 84-87 doi:10.1107/s0567739478014515

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Reference TypeJournal (article/letter/editorial)
TitleInfluence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry
JournalActa Crystallographica Section A
AuthorsOlsen, J. S.Author
Buras, B.Author
Jensen, T.Author
Alstrup, O.Author
Gerward, L.Author
Selsmark, B.Author
Year1978 (January 1)Volume34
Issue1
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0567739478014515Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID181695Long-form Identifiermindat:1:5:181695:6
GUID0
Full ReferenceOlsen, J. S., Buras, B., Jensen, T., Alstrup, O., Gerward, L., Selsmark, B. (1978) Influence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry. Acta Crystallographica Section A, 34 (1) 84-87 doi:10.1107/s0567739478014515
Plain TextOlsen, J. S., Buras, B., Jensen, T., Alstrup, O., Gerward, L., Selsmark, B. (1978) Influence of the incident beam on integrated intensities in X-ray energy-dispersive diffractometry. Acta Crystallographica Section A, 34 (1) 84-87 doi:10.1107/s0567739478014515
In(1978, January) Acta Crystallographica Section A Vol. 34 (1) International Union of Crystallography (IUCr)

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Buras, B., Olsen, J. S., Gerward, L., Selsmark, B., Andersen, A. L. (1975) Energy-dispersive spectroscopic methods applied to X-ray diffraction in single crystals. Acta Crystallographica Section A, 31 (3) 327-333 doi:10.1107/s0567739475000691
Staun Olsen, J., Buras, B., Steenstrup, J., Gerward, L. (1981) An X-ray energy-dispersive diffractometer for synchrotron radiation. Acta Crystallographica Section A Foundations of Crystallography, 37. doi:10.1107/s0108767381090429
Buras, B., Olsen, J.Staun, Gerward, L. (1978) White beam, X-ray, energy-dispersive diffractometry using synchrotron radiation. Nuclear Instruments and Methods, 152 (1). 293-296 doi:10.1016/0029-554x(78)90282-3
Buras, B., Olsen, J. S., Gerward, L., Will, G., Hinze, E. (1977) X-ray energy-dispersive diffractometry using synchrotron radiation. Journal of Applied Crystallography, 10 (6) 431-438 doi:10.1107/s0021889877013910
Buras, B., Niimura, N., Olsen, J. S. (1978) Optimum resolution in X-ray energy-dispersive diffractometry. Journal of Applied Crystallography, 11 (2) 137-140 doi:10.1107/s002188987801290x
Buras, B., Olsen, J. S., Andersen, A. L., Gerward, L., Selsmark, B. (1974) Evidence of escape peaks caused by a Si(Li) detector in energy-dispersive diffraction spectra. Journal of Applied Crystallography, 7 (2) 296-297 doi:10.1107/s0021889874009587
Buras, B., Staun Olsen, J., Gerward, L. (1976) X-ray energy-dispersive powder diffractometry using synchrotron radiation. Nuclear Instruments and Methods, 135 (1). 193-195 doi:10.1016/0029-554x(76)90845-4
Buras, B., Gerward, L. (1975) Relations between integrated intensities in crystal diffraction methods for X-rays and neutrons. Acta Crystallographica Section A, 31 (3) 372-374 doi:10.1107/s0567739475000782
Cousins, C. S. G., Gerward, L., Staun Olsen, J., Selsmark, B., Sheldon, B. J. (1982) Determination of internal strain tensors by energy-dispersive X-ray diffraction: Results for Si using the 006 forbidden reflection. Journal of Applied Crystallography, 15 (2) 154-159 doi:10.1107/s0021889882011704
Fukamachi, T., Hosoya, S., Kawamura, T., Okonuki, M. (1977) X-ray intensity measurements on large crystals by energy-dispersive diffractometry. III. Fine structures of integrated intensities and anomalous scattering factors near theKabsorption edges in GaAs. Acta Crystallographica Section A, 33 (1) 54-58 doi:10.1107/s0567739477000138
Fukamachi, T., Hosoya, S., Okunuki, M. (1976) X-ray intensity measurements on large crystals by energy-dispersive diffractometry. I. Energy dependence of diffraction intensities near the absorption edge. Acta Crystallographica Section A, 32 (1) 104-109 doi:10.1107/s0567739476000193
 
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