| Reference Type | Journal (article/letter/editorial) |
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| Title | High-Frequency Characterization of Porous Low-Temperature Cofired Ceramics Substrates |
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| Journal | Journal of the American Ceramic Society |
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| Authors | Bittner, Achim | Author |
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| Seidel, Helmut | Author |
| Schmid, Ulrich | Author |
| Year | 2010 (November) | Volume | 93 |
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| Issue | 11 |
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| Publisher | Wiley |
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| DOI | doi:10.1111/j.1551-2916.2010.03928.xSearch in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 4100909 | Long-form Identifier | mindat:1:5:4100909:9 |
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|
| GUID | 0 |
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| Full Reference | Bittner, Achim, Seidel, Helmut, Schmid, Ulrich (2010) High-Frequency Characterization of Porous Low-Temperature Cofired Ceramics Substrates. Journal of the American Ceramic Society, 93 (11). 3778-3781 doi:10.1111/j.1551-2916.2010.03928.x |
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| Plain Text | Bittner, Achim, Seidel, Helmut, Schmid, Ulrich (2010) High-Frequency Characterization of Porous Low-Temperature Cofired Ceramics Substrates. Journal of the American Ceramic Society, 93 (11). 3778-3781 doi:10.1111/j.1551-2916.2010.03928.x |
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| In | (2010, November) Journal of the American Ceramic Society Vol. 93 (11) Wiley |
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These are possibly similar items as determined by title/reference text matching only.