| Reference Type | Journal (article/letter/editorial) |
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| Title | Failure Mechanism of a Low-Temperature-Cofired Ceramic Capacitor with an Inner Ag Electrode |
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| Journal | Journal of the American Ceramic Society |
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| Authors | Shih, Yi-Ting | Author |
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| Jean, Jau-Ho | Author |
| Lin, Shih-Chang | Author |
| Year | 2010 (October) | Volume | 93 |
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| Issue | 10 |
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| Publisher | Wiley |
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| DOI | doi:10.1111/j.1551-2916.2010.03837.xSearch in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 4100797 | Long-form Identifier | mindat:1:5:4100797:6 |
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| GUID | 0 |
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| Full Reference | Shih, Yi-Ting, Jean, Jau-Ho, Lin, Shih-Chang (2010) Failure Mechanism of a Low-Temperature-Cofired Ceramic Capacitor with an Inner Ag Electrode. Journal of the American Ceramic Society, 93 (10). 3278-3283 doi:10.1111/j.1551-2916.2010.03837.x |
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| Plain Text | Shih, Yi-Ting, Jean, Jau-Ho, Lin, Shih-Chang (2010) Failure Mechanism of a Low-Temperature-Cofired Ceramic Capacitor with an Inner Ag Electrode. Journal of the American Ceramic Society, 93 (10). 3278-3283 doi:10.1111/j.1551-2916.2010.03837.x |
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| In | (2010, October) Journal of the American Ceramic Society Vol. 93 (10) Wiley |
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These are possibly similar items as determined by title/reference text matching only.
