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Birkan Selçuk, A., Tuğluoğlu, N., Karadeniz, S., Bilge Ocak, S. (2007) Analysis of frequency-dependent series resistance and interface states of In/SiO2/p-Si (MIS) structures. Physica B: Condensed Matter, 400 (1). 149-154 doi:10.1016/j.physb.2007.06.031

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Reference TypeJournal (article/letter/editorial)
TitleAnalysis of frequency-dependent series resistance and interface states of In/SiO2/p-Si (MIS) structures
JournalPhysica B: Condensed Matter
AuthorsBirkan Selçuk, A.Author
Tuğluoğlu, N.Author
Karadeniz, S.Author
Bilge Ocak, S.Author
Year2007 (November)Volume400
Issue1
PublisherElsevier BV
DOIdoi:10.1016/j.physb.2007.06.031Search in ResearchGate
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Mindat Ref. ID4064693Long-form Identifiermindat:1:5:4064693:6
GUID0
Full ReferenceBirkan Selçuk, A., Tuğluoğlu, N., Karadeniz, S., Bilge Ocak, S. (2007) Analysis of frequency-dependent series resistance and interface states of In/SiO2/p-Si (MIS) structures. Physica B: Condensed Matter, 400 (1). 149-154 doi:10.1016/j.physb.2007.06.031
Plain TextBirkan Selçuk, A., Tuğluoğlu, N., Karadeniz, S., Bilge Ocak, S. (2007) Analysis of frequency-dependent series resistance and interface states of In/SiO2/p-Si (MIS) structures. Physica B: Condensed Matter, 400 (1). 149-154 doi:10.1016/j.physb.2007.06.031
In(2007, November) Physica B: Condensed Matter Vol. 400 (1) Elsevier BV

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Korucu, D., Duman, S. (2015) Frequency and Temperature Dependent Interface States and Series Resistance in Au/SiO2/p-Si (MIS) Diode. Science of Advanced Materials, 7. 1291-1297 doi:10.1166/sam.2015.2043
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