| Reference Type | Journal (article/letter/editorial) |
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| Title | Microstructure and field emission properties of the Si–TaSi2 eutectic in situ composites by electron beam floating zone melting technique |
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| Journal | Journal of Crystal Growth |
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| Authors | Cui, Chunjuan | Author |
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| Zhang, Jun | Author |
| Jia, Zhiwei | Author |
| Su, Haijun | Author |
| Liu, Lin | Author |
| Fu, Hengzhi | Author |
| Year | 2008 (January) | Volume | 310 |
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| Issue | 1 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/j.jcrysgro.2007.10.023Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 2891050 | Long-form Identifier | mindat:1:5:2891050:1 |
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|
| GUID | 0 |
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| Full Reference | Cui, Chunjuan, Zhang, Jun, Jia, Zhiwei, Su, Haijun, Liu, Lin, Fu, Hengzhi (2008) Microstructure and field emission properties of the Si–TaSi2 eutectic in situ composites by electron beam floating zone melting technique. Journal of Crystal Growth, 310 (1). 71-77 doi:10.1016/j.jcrysgro.2007.10.023 |
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| Plain Text | Cui, Chunjuan, Zhang, Jun, Jia, Zhiwei, Su, Haijun, Liu, Lin, Fu, Hengzhi (2008) Microstructure and field emission properties of the Si–TaSi2 eutectic in situ composites by electron beam floating zone melting technique. Journal of Crystal Growth, 310 (1). 71-77 doi:10.1016/j.jcrysgro.2007.10.023 |
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| In | (2008, January) Journal of Crystal Growth Vol. 310 (1) Elsevier BV |
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