| Reference Type | Journal (article/letter/editorial) |
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| Title | Microstructure characteristics and interface morphology evolvement of Si-TaSi2 eutectic in situ composite for field emission |
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| Journal | Journal of Crystal Growth |
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| Authors | Cui, Chunjuan | Author |
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| Zhang, Jun | Author |
| Li, Bo | Author |
| Han, Min | Author |
| Liu, Lin | Author |
| Fu, Hengzhi | Author |
| Year | 2007 (February) | Volume | 299 |
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| Issue | 2 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/j.jcrysgro.2006.11.248Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 2888176 | Long-form Identifier | mindat:1:5:2888176:8 |
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|
| GUID | 0 |
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| Full Reference | Cui, Chunjuan, Zhang, Jun, Li, Bo, Han, Min, Liu, Lin, Fu, Hengzhi (2007) Microstructure characteristics and interface morphology evolvement of Si-TaSi2 eutectic in situ composite for field emission. Journal of Crystal Growth, 299 (2). 248-253 doi:10.1016/j.jcrysgro.2006.11.248 |
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| Plain Text | Cui, Chunjuan, Zhang, Jun, Li, Bo, Han, Min, Liu, Lin, Fu, Hengzhi (2007) Microstructure characteristics and interface morphology evolvement of Si-TaSi2 eutectic in situ composite for field emission. Journal of Crystal Growth, 299 (2). 248-253 doi:10.1016/j.jcrysgro.2006.11.248 |
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| In | (2007, February) Journal of Crystal Growth Vol. 299 (2) Elsevier BV |
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