| Reference Type | Journal (article/letter/editorial) |
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| Title | Extremely high Be doping of InGaAs by low-temperature atomic layer epitaxy |
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| Journal | Journal of Crystal Growth |
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| Authors | Ohtsuka, N. | Author |
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| Kodama, K. | Author |
| Ozeki, M. | Author |
| Sakuma, Y. | Author |
| Year | 1991 (December) | Volume | 115 |
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| Issue | 1 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/0022-0248(91)90786-5Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 2804064 | Long-form Identifier | mindat:1:5:2804064:4 |
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| GUID | 0 |
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| Full Reference | Ohtsuka, N., Kodama, K., Ozeki, M., Sakuma, Y. (1991) Extremely high Be doping of InGaAs by low-temperature atomic layer epitaxy. Journal of Crystal Growth, 115 (1). 460-463 doi:10.1016/0022-0248(91)90786-5 |
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| Plain Text | Ohtsuka, N., Kodama, K., Ozeki, M., Sakuma, Y. (1991) Extremely high Be doping of InGaAs by low-temperature atomic layer epitaxy. Journal of Crystal Growth, 115 (1). 460-463 doi:10.1016/0022-0248(91)90786-5 |
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| In | (1991, December) Journal of Crystal Growth Vol. 115 (1) Elsevier BV |
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