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Saketh Ram, Mamidala, Svensson, Johannes, Wernersson, Lars-Erik (2023) Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors. ACS Applied Materials & Interfaces, 15 (15) 19085-19091 doi:10.1021/acsami.2c21669

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Reference TypeJournal (article/letter/editorial)
TitleEffects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors
JournalACS Applied Materials & Interfaces
AuthorsSaketh Ram, MamidalaAuthor
Svensson, JohannesAuthor
Wernersson, Lars-ErikAuthor
Year2023 (April 19)Volume15
Issue15
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/acsami.2c21669Search in ResearchGate
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Mindat Ref. ID15804189Long-form Identifiermindat:1:5:15804189:8
GUID0
Full ReferenceSaketh Ram, Mamidala, Svensson, Johannes, Wernersson, Lars-Erik (2023) Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors. ACS Applied Materials & Interfaces, 15 (15) 19085-19091 doi:10.1021/acsami.2c21669
Plain TextSaketh Ram, Mamidala, Svensson, Johannes, Wernersson, Lars-Erik (2023) Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors. ACS Applied Materials & Interfaces, 15 (15) 19085-19091 doi:10.1021/acsami.2c21669
In(2023, April) ACS Applied Materials & Interfaces Vol. 15 (15) American Chemical Society (ACS)

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