| Reference Type | Journal (article/letter/editorial) |
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| Title | X-ray studies on protoenstatite |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Murakami, Takashi | Author |
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| Takéuchi, Yoshio | Author |
| Yamanaka, Takamitsu | Author |
| Year | 1984 (January 1) | Volume | 166 |
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| Issue | 3-4 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.1984.166.3-4.263Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 110539 | Long-form Identifier | mindat:1:5:110539:5 |
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| GUID | 0 |
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| Full Reference | Murakami, Takashi, Takéuchi, Yoshio, Yamanaka, Takamitsu (1984) X-ray studies on protoenstatite. Zeitschrift für Kristallographie - Crystalline Materials, 166 (3-4) 263 doi:10.1524/zkri.1984.166.3-4.263 |
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| Plain Text | Murakami, Takashi, Takéuchi, Yoshio, Yamanaka, Takamitsu (1984) X-ray studies on protoenstatite. Zeitschrift für Kristallographie - Crystalline Materials, 166 (3-4) 263 doi:10.1524/zkri.1984.166.3-4.263 |
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| In | (1984, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 166 (3-4) Walter de Gruyter GmbH |
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| Abstract/Notes | AbstractDiffraction intensity data of well ordered protoenstatite, MgSiO(1) The variations of the(2) The expansion of the(3) The structure underwent a minor sudden change at around 1300°C; the O1 atoms were displaced approximately towards the Si atoms along the |
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