| Reference Type | Journal (article/letter/editorial) |
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| Title | Gas-flame, high-temperature apparatus for single-crystal X-ray diffraction studies |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Yamanaka, Takamitsu | Author |
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| Takéuchi, Yoshio | Author |
| Sadanaga, Ryoichi | Author |
| Year | 1981 (January 1) | Volume | 154 |
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| Issue | 1-2 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.1981.154.1-2.147Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 109794 | Long-form Identifier | mindat:1:5:109794:2 |
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| GUID | 0 |
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| Full Reference | Yamanaka, Takamitsu, Takéuchi, Yoshio, Sadanaga, Ryoichi (1981) Gas-flame, high-temperature apparatus for single-crystal X-ray diffraction studies. Zeitschrift für Kristallographie - Crystalline Materials, 154 (1-2) 147 doi:10.1524/zkri.1981.154.1-2.147 |
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| Plain Text | Yamanaka, Takamitsu, Takéuchi, Yoshio, Sadanaga, Ryoichi (1981) Gas-flame, high-temperature apparatus for single-crystal X-ray diffraction studies. Zeitschrift für Kristallographie - Crystalline Materials, 154 (1-2) 147 doi:10.1524/zkri.1981.154.1-2.147 |
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| In | (1981, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 154 (1-2) Walter de Gruyter GmbH |
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| Abstract/Notes | AbstractA new high-temperature gas-flame heater utilizing three different kinds of gases has been constructed for single-crystal diffractometry and for photography. The whole system of the heater consists of a burner and gas controller. The temperature control of the heater is carried out by changing the ratio of the flow rates of propane, oxygen and nitrogen gases; the third gas plays a role in increasing blower pressure of the flame and reducing fluctuation of the sample temperature. The heater can thus stably provide a temperature ranging from about 1000°C up to about 2000 °C within a deviation of ± 20 °C.The burner has at its end a nozzle head in which five holes are so opened that gas flowing through the holes converges to a point 10 mm distant from the head. An accessory device is described which facilitates measuring directly the sample temperatures during the collection of reflection intensities with the single-crystal diffractometer. |
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