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Kulesza, B. L. J., Thorp, J. S., Ahmad, A. Bakar (1984) Coaxial line methods for measuring permittivity and dielectric loss. Journal of Materials Science, 19. 915-922 doi:10.1007/bf00540461

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Reference TypeJournal (article/letter/editorial)
TitleCoaxial line methods for measuring permittivity and dielectric loss
JournalJournal of Materials Science
AuthorsKulesza, B. L. J.Author
Thorp, J. S.Author
Ahmad, A. BakarAuthor
Year1984 (March)Volume19
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00540461Search in ResearchGate
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Mindat Ref. ID9986328Long-form Identifiermindat:1:5:9986328:5
GUID0
Full ReferenceKulesza, B. L. J., Thorp, J. S., Ahmad, A. Bakar (1984) Coaxial line methods for measuring permittivity and dielectric loss. Journal of Materials Science, 19. 915-922 doi:10.1007/bf00540461
Plain TextKulesza, B. L. J., Thorp, J. S., Ahmad, A. Bakar (1984) Coaxial line methods for measuring permittivity and dielectric loss. Journal of Materials Science, 19. 915-922 doi:10.1007/bf00540461
In(n.d.) Journal of Materials Science Vol. 19. Springer Science and Business Media LLC

See Also

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Thorp, J. S., Ahmad, A. B., Kulesza, B. L. J., Bushell, T. G. (1984) The permittivity and dielectric loss of reaction-bonded silicon nitride. Journal of Materials Science, 19. 3680-3686 doi:10.1007/bf02396940
Thorp, J. S., Ahmad, A. B., Kulesza, B. L. J., Kenmuir, S. V. J. (1984) High-frequency dielectric properties of Mg-Al-Si, Ca-Al-Si and Y-Al-Si oxynitride glasses. Journal of Materials Science, 19. 3211-3216 doi:10.1007/bf00549806
Thorp, J. S., Rad, N. E., Kulesza, B. I. J. (1985) RF permittivity and dielectric loss in binary molybdenum-phosphate glasses. Journal of Materials Science Letters, 4 (7) 895-897 doi:10.1007/bf00720532
Thorp, J. S., Kulesza, B. L. J., Rad, N. E., Kenmuir, S. V. J. (1981) High frequency dielectric properties of MgO, Fe/MgO and Cr/MgO. Journal of Materials Science, 16. 1052-1058 doi:10.1007/bf00542751
Thorp, J. S., Rad, N. E. (1986) The r.f. permittivity and dielectric loss of calcium, iron and magnesium silicides. Journal of Materials Science Letters, 5 (2) 157-158 doi:10.1007/bf01672032
Kenmuir, S. V. J., Thorp, J. S., Kulesza, B. L. J. (1983) The dielectric behaviour of Mg-Al-Si, Ca-Al-Si, Y-Al-Si and Nd-Al-Si oxynitride glasses. Journal of Materials Science, 18. 1725-1730 doi:10.1007/bf00542068
Thorp, J. S., Bushell, T. G., Evans, D., Rad, N. E. (1987) The temperature and frequency dependencies of permittivity and dielectric loss in reaction bonded silicon nitride. Journal of Materials Science, 22. 2641-2644 doi:10.1007/bf01082157
Thorp, J. S., Ammar, E. A. E. (1975) The dielectric constants of CaWO4, Nd/CaWO4 and Gd/CaWO4. Journal of Materials Science, 10. 918-922 doi:10.1007/bf00823207
Szwarnowski, S, Sheppard, R J (1979) A coaxial line system for measuring the permittivity of conductive liquids. Journal of Physics E: Scientific Instruments, 12 (10). 937-940 doi:10.1088/0022-3735/12/10/013
Pointon, A J, Woodman, K F (1971) A coaxial cavity for measuring the dielectric properties of high permittivity materials. Journal of Physics E: Scientific Instruments, 4 (3). 208-212 doi:10.1088/0022-3735/4/3/013
Nightingale, N R V, Szwarnowski, S, Sheppard, R J, Grant, E H (1981) A coaxial line cell for measuring the permittivity of medium to high loss liquids in the frequency range 2 to 15 GHz. Journal of Physics E: Scientific Instruments, 14 (2). 156-160 doi:10.1088/0022-3735/14/2/007
 
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