| Reference Type | Journal (article/letter/editorial) |
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| Title | A scanning electron microscope study of the role of copper oxide layers on arc cathode erosion rates |
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| Journal | Journal of Materials Science |
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| Authors | Hitchcock, A. H. | Author |
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| Guile, A. E. | Author |
| Year | 1977 (June) | Volume | 12 |
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| Publisher | Springer Science and Business Media LLC |
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| DOI | doi:10.1007/bf02426845Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 9983254 | Long-form Identifier | mindat:1:5:9983254:0 |
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| GUID | 0 |
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| Full Reference | Hitchcock, A. H., Guile, A. E. (1977) A scanning electron microscope study of the role of copper oxide layers on arc cathode erosion rates. Journal of Materials Science, 12. 1095-1104 doi:10.1007/bf02426845 |
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| Plain Text | Hitchcock, A. H., Guile, A. E. (1977) A scanning electron microscope study of the role of copper oxide layers on arc cathode erosion rates. Journal of Materials Science, 12. 1095-1104 doi:10.1007/bf02426845 |
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| In | (n.d.) Journal of Materials Science Vol. 12. Springer Science and Business Media LLC |
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