Maslakov, Konstantin I., Teterin, Yury A., Popel, Aleksej J., Teterin, Anton Yu., Ivanov, Kirill E., Kalmykov, Stepan N., Petrov, Vladimir G., Petrov, Peter K., Farnan, Ian (2018) XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples. Applied Surface Science, 448. 154-162 doi:10.1016/j.apsusc.2018.04.077
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples | ||
| Journal | Applied Surface Science | ||
| Authors | Maslakov, Konstantin I. | Author | |
| Teterin, Yury A. | Author | ||
| Popel, Aleksej J. | Author | ||
| Teterin, Anton Yu. | Author | ||
| Ivanov, Kirill E. | Author | ||
| Kalmykov, Stepan N. | Author | ||
| Petrov, Vladimir G. | Author | ||
| Petrov, Peter K. | Author | ||
| Farnan, Ian | Author | ||
| Year | 2018 (August) | Volume | 448 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.apsusc.2018.04.077Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9934582 | Long-form Identifier | mindat:1:5:9934582:2 |
| GUID | 0 | ||
| Full Reference | Maslakov, Konstantin I., Teterin, Yury A., Popel, Aleksej J., Teterin, Anton Yu., Ivanov, Kirill E., Kalmykov, Stepan N., Petrov, Vladimir G., Petrov, Peter K., Farnan, Ian (2018) XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples. Applied Surface Science, 448. 154-162 doi:10.1016/j.apsusc.2018.04.077 | ||
| Plain Text | Maslakov, Konstantin I., Teterin, Yury A., Popel, Aleksej J., Teterin, Anton Yu., Ivanov, Kirill E., Kalmykov, Stepan N., Petrov, Vladimir G., Petrov, Peter K., Farnan, Ian (2018) XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples. Applied Surface Science, 448. 154-162 doi:10.1016/j.apsusc.2018.04.077 | ||
| In | (n.d.) Applied Surface Science Vol. 448. Elsevier BV | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
