| Reference Type | Journal (article/letter/editorial) |
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| Title | Nanoscale resistive random access memory consisting of a NiO nanodot and Au nanowires formed by dip-pen nanolithography |
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| Journal | Applied Surface Science |
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| Authors | Son, Jong Yeog | Author |
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| Shin, Yun-Sok | Author |
| Shin, Young-Han | Author |
| Year | 2011 (September) | Volume | 257 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/j.apsusc.2011.06.076Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 9916630 | Long-form Identifier | mindat:1:5:9916630:4 |
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| GUID | 0 |
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| Full Reference | Son, Jong Yeog, Shin, Yun-Sok, Shin, Young-Han (2011) Nanoscale resistive random access memory consisting of a NiO nanodot and Au nanowires formed by dip-pen nanolithography. Applied Surface Science, 257. 9885-9887 doi:10.1016/j.apsusc.2011.06.076 |
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| Plain Text | Son, Jong Yeog, Shin, Yun-Sok, Shin, Young-Han (2011) Nanoscale resistive random access memory consisting of a NiO nanodot and Au nanowires formed by dip-pen nanolithography. Applied Surface Science, 257. 9885-9887 doi:10.1016/j.apsusc.2011.06.076 |
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| In | (n.d.) Applied Surface Science Vol. 257. Elsevier BV |
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