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He, Bob B. (2011) MicroGap Area Detector for Stress and Texture Analysis. Materials Science Forum, 681. 19-24 doi:10.4028/www.scientific.net/msf.681.19

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Reference TypeJournal (article/letter/editorial)
TitleMicroGap Area Detector for Stress and Texture Analysis
JournalMaterials Science Forum
AuthorsHe, Bob B.Author
Year2011 (March)Volume681
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.681.19Search in ResearchGate
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Mindat Ref. ID9873376Long-form Identifiermindat:1:5:9873376:5
GUID0
Full ReferenceHe, Bob B. (2011) MicroGap Area Detector for Stress and Texture Analysis. Materials Science Forum, 681. 19-24 doi:10.4028/www.scientific.net/msf.681.19
Plain TextHe, Bob B. (2011) MicroGap Area Detector for Stress and Texture Analysis. Materials Science Forum, 681. 19-24 doi:10.4028/www.scientific.net/msf.681.19
In(2011) Materials Science Forum Vol. 681. Trans Tech Publications, Ltd.

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He, Bob B. (2011) Recent Advances in Texture Measurement Using Two-Dimensional Detector. Materials Science Forum, 702. 507-510 doi:10.4028/www.scientific.net/msf.702-703.507
He, Bob B. (2013) XRD2 Stress Measurement for Samples with Texture and Large Grains. Materials Science Forum, 768. 227-234 doi:10.4028/www.scientific.net/msf.768-769.227
He, Bob B., Preckwinkel, Uwe, Smith, Kingsley L. (2002) Stress and Texture Analysis with Two-Dimensional X-Ray Diffraction. Materials Science Forum, 404. 109-114 doi:10.4028/www.scientific.net/msf.404-407.109
He, Bob B., Smith, Kingsley L., Preckwinkel, Uwe, schultz, Willard (2000) Micro-Area Residual Stress Measurement Using a Two-Dimensional Detector. Materials Science Forum, 347. 101-106 doi:10.4028/www.scientific.net/msf.347-349.101
He, Bob B., Smith, Kingsley L., Preckwinkel, Uwe, schultz, Willard (2000) Gage R&R Study on Residual Stress Measurement System with Area Detector. Materials Science Forum, 347. 166-171 doi:10.4028/www.scientific.net/msf.347-349.166
Schubert, A., Michel, Bernd, Kämpfe, B. (1996) Stress Analysis Using an Area Detector. Materials Science Forum, 228. 125-130 doi:10.4028/www.scientific.net/msf.228-231.125
He, Bob B., Xu, Ke Wei, Wang, Fei, Huang, Ping (2005) Two-Dimensional X-Ray Diffraction for Structure and Stress Analysis. Materials Science Forum, 490. 1-6 doi:10.4028/www.scientific.net/msf.490-491.1
He, Bob B. (2014) Gamma Profile Analysis for Stress, Texture and Grain Size. Advanced Materials Research, 996. 209-214 doi:10.4028/www.scientific.net/amr.996.209
Ortolani, Matteo, Azanza Ricardo, Cristy Leonor, Lausi, Andrea, Scardi, Paolo (2011) Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA. Materials Science Forum, 681. 115-120 doi:10.4028/www.scientific.net/msf.681.115
(2011) Materials Science Forum, 681. Trans Tech Publications, Ltd. doi:10.4028/www.scientific.net/msf.681
Martins, René V., Francis, John A. (2011) Residual Stress, Texture, and Phase Investigation of Autogenous Edge Welds Using High Energy Synchrotron Radiation. Materials Science Forum, 681. 43-48 doi:10.4028/www.scientific.net/msf.681.43
 
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