Pollock, Hubert (2010) Towards Chemical Mapping at Sub-Micron Resolution: Near-Field Spectroscopic Delineation of Interphase Boundaries. Materials Science Forum, 662. 1-11 doi:10.4028/www.scientific.net/msf.662.1
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Towards Chemical Mapping at Sub-Micron Resolution: Near-Field Spectroscopic Delineation of Interphase Boundaries | ||
| Journal | Materials Science Forum | ||
| Authors | Pollock, Hubert | Author | |
| Year | 2010 (November) | Volume | 662 |
| Publisher | Trans Tech Publications, Ltd. | ||
| DOI | doi:10.4028/www.scientific.net/msf.662.1Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9872035 | Long-form Identifier | mindat:1:5:9872035:4 |
| GUID | 0 | ||
| Full Reference | Pollock, Hubert (2010) Towards Chemical Mapping at Sub-Micron Resolution: Near-Field Spectroscopic Delineation of Interphase Boundaries. Materials Science Forum, 662. 1-11 doi:10.4028/www.scientific.net/msf.662.1 | ||
| Plain Text | Pollock, Hubert (2010) Towards Chemical Mapping at Sub-Micron Resolution: Near-Field Spectroscopic Delineation of Interphase Boundaries. Materials Science Forum, 662. 1-11 doi:10.4028/www.scientific.net/msf.662.1 | ||
| In | (2010) Materials Science Forum Vol. 662. Trans Tech Publications, Ltd. | ||
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