Ge, Yan Ling, Aaltio, Ilkka, Söderberg, Outi, Hannula, Simo Pekka (2009) X-Ray Diffraction Reciprocal Space Mapping Study of Modulated Crystal Structures in 10M Ni-Mn-Ga Martensitic Phase. Materials Science Forum, 635. 63-68 doi:10.4028/www.scientific.net/msf.635.63
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | X-Ray Diffraction Reciprocal Space Mapping Study of Modulated Crystal Structures in 10M Ni-Mn-Ga Martensitic Phase | ||
| Journal | Materials Science Forum | ||
| Authors | Ge, Yan Ling | Author | |
| Aaltio, Ilkka | Author | ||
| Söderberg, Outi | Author | ||
| Hannula, Simo Pekka | Author | ||
| Year | 2009 (December) | Volume | 635 |
| Publisher | Trans Tech Publications, Ltd. | ||
| DOI | doi:10.4028/www.scientific.net/msf.635.63Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9869411 | Long-form Identifier | mindat:1:5:9869411:0 |
| GUID | 0 | ||
| Full Reference | Ge, Yan Ling, Aaltio, Ilkka, Söderberg, Outi, Hannula, Simo Pekka (2009) X-Ray Diffraction Reciprocal Space Mapping Study of Modulated Crystal Structures in 10M Ni-Mn-Ga Martensitic Phase. Materials Science Forum, 635. 63-68 doi:10.4028/www.scientific.net/msf.635.63 | ||
| Plain Text | Ge, Yan Ling, Aaltio, Ilkka, Söderberg, Outi, Hannula, Simo Pekka (2009) X-Ray Diffraction Reciprocal Space Mapping Study of Modulated Crystal Structures in 10M Ni-Mn-Ga Martensitic Phase. Materials Science Forum, 635. 63-68 doi:10.4028/www.scientific.net/msf.635.63 | ||
| In | (2009) Materials Science Forum Vol. 635. Trans Tech Publications, Ltd. | ||
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