| Reference Type | Journal (article/letter/editorial) |
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| Title | In Situ Transmission Electron Microscopy Investigation of the Deformation Behavior of Cu with Nanoscale Twins |
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| Journal | Materials Science Forum |
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| Authors | Wang, Y. B. | Author |
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| Sui, M.L. | Author |
| Year | 2009 (November) | Volume | 633 |
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| Publisher | Trans Tech Publications, Ltd. |
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| DOI | doi:10.4028/www.scientific.net/msf.633-634.63Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 9869375 | Long-form Identifier | mindat:1:5:9869375:9 |
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| GUID | 0 |
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| Full Reference | Wang, Y. B., Sui, M.L. (2009) In Situ Transmission Electron Microscopy Investigation of the Deformation Behavior of Cu with Nanoscale Twins. Materials Science Forum, 633. 63-72 doi:10.4028/www.scientific.net/msf.633-634.63 |
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| Plain Text | Wang, Y. B., Sui, M.L. (2009) In Situ Transmission Electron Microscopy Investigation of the Deformation Behavior of Cu with Nanoscale Twins. Materials Science Forum, 633. 63-72 doi:10.4028/www.scientific.net/msf.633-634.63 |
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| In | (2009) Materials Science Forum Vol. 633. Trans Tech Publications, Ltd. |
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