Khayyat, Maha M., Hasko, David G., Chaudhri, M. Munawar (2005) Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon. Materials Science Forum, 480. 225-230 doi:10.4028/www.scientific.net/msf.480-481.225
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon | ||
| Journal | Materials Science Forum | ||
| Authors | Khayyat, Maha M. | Author | |
| Hasko, David G. | Author | ||
| Chaudhri, M. Munawar | Author | ||
| Year | 2005 (March) | Volume | 480 |
| Publisher | Trans Tech Publications, Ltd. | ||
| DOI | doi:10.4028/www.scientific.net/msf.480-481.225Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9857792 | Long-form Identifier | mindat:1:5:9857792:9 |
| GUID | 0 | ||
| Full Reference | Khayyat, Maha M., Hasko, David G., Chaudhri, M. Munawar (2005) Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon. Materials Science Forum, 480. 225-230 doi:10.4028/www.scientific.net/msf.480-481.225 | ||
| Plain Text | Khayyat, Maha M., Hasko, David G., Chaudhri, M. Munawar (2005) Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon. Materials Science Forum, 480. 225-230 doi:10.4028/www.scientific.net/msf.480-481.225 | ||
| In | (2005) Materials Science Forum Vol. 480. Trans Tech Publications, Ltd. | ||
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