Akita, Koichi, Kubota, Kohei, Yoshioka, Yasuo, Suzuki, Hiroshi (2002) Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation. Materials Science Forum, 404. 293-298 doi:10.4028/www.scientific.net/msf.404-407.293
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation | ||
| Journal | Materials Science Forum | ||
| Authors | Akita, Koichi | Author | |
| Kubota, Kohei | Author | ||
| Yoshioka, Yasuo | Author | ||
| Suzuki, Hiroshi | Author | ||
| Year | 2002 (August) | Volume | 404 |
| Publisher | Trans Tech Publications, Ltd. | ||
| DOI | doi:10.4028/www.scientific.net/msf.404-407.293Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9852474 | Long-form Identifier | mindat:1:5:9852474:1 |
| GUID | 0 | ||
| Full Reference | Akita, Koichi, Kubota, Kohei, Yoshioka, Yasuo, Suzuki, Hiroshi (2002) Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation. Materials Science Forum, 404. 293-298 doi:10.4028/www.scientific.net/msf.404-407.293 | ||
| Plain Text | Akita, Koichi, Kubota, Kohei, Yoshioka, Yasuo, Suzuki, Hiroshi (2002) Analysis of Depth Profiles of Residual Stress Using Synchrotron Radiation. Materials Science Forum, 404. 293-298 doi:10.4028/www.scientific.net/msf.404-407.293 | ||
| In | (2002) Materials Science Forum Vol. 404. Trans Tech Publications, Ltd. | ||
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