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Gerth, D., Schwarzer, Robert A. (1993) The Development of Grain-Specific Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates. Materials Science Forum, 113. 619-624 doi:10.4028/www.scientific.net/msf.113-115.619

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Reference TypeJournal (article/letter/editorial)
TitleThe Development of Grain-Specific Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates
JournalMaterials Science Forum
AuthorsGerth, D.Author
Schwarzer, Robert A.Author
Year1993 (January)Volume113
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/msf.113-115.619Search in ResearchGate
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Mindat Ref. ID9840883Long-form Identifiermindat:1:5:9840883:2
GUID0
Full ReferenceGerth, D., Schwarzer, Robert A. (1993) The Development of Grain-Specific Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates. Materials Science Forum, 113. 619-624 doi:10.4028/www.scientific.net/msf.113-115.619
Plain TextGerth, D., Schwarzer, Robert A. (1993) The Development of Grain-Specific Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates. Materials Science Forum, 113. 619-624 doi:10.4028/www.scientific.net/msf.113-115.619
In(1993) Materials Science Forum Vol. 113. Trans Tech Publications, Ltd.

See Also

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Gerth, D., Schwarzer, Robert A. (1993) The Effect of Grain-Specific Texture on Hillock Growth in Al-1%Si Films on SiO2/Si Substrates. Materials Science Forum, 113. 625-630 doi:10.4028/www.scientific.net/msf.113-115.625
Gerth, D., Zaefferer, Stefan, Schwarzer, Robert A. (1994) Stress-Induced Grain Growth in Thin Al-1%Si Layers on Si/SiO2 Substrates. Materials Science Forum, 157. 1205-1210 doi:10.4028/www.scientific.net/msf.157-162.1205
Gerth, D., Katzer, D., Schwarzer, R. (1992) Correlation between Grain Growth and Hillock Growth in Thin Thermally Annealed Al-1%Si Films on Silicon Substrates. Materials Science Forum, 94. 557-562 doi:10.4028/www.scientific.net/msf.94-96.557
Katzer, D., Gerth, D., Riesenberg, R. (1992) HVEM In Situ Investigation of Stress-Induced Grain Growth during Thermal Annealing of Thin Al-Alloy Films on a Si/SiO2 Substrate. Materials Science Forum, 94. 551-556 doi:10.4028/www.scientific.net/msf.94-96.551
Su, C.M., Bohn, H.G. (1993) Interface Constraint on Grain Boundary Relaxation in Thin Al- and Al-Alloy Films on Si-Substrates. Materials Science Forum, 119. 285-290 doi:10.4028/www.scientific.net/msf.119-121.285
Gerth, D., Katzer, D., Schwarzer, R. A. (1994) The influence of local thermomechanical stress on grain growth in thin Al-1%Si layers on SiO2/Si substrates. physica status solidi (a), 146 (1). 299-316 doi:10.1002/pssa.2211460126
Lange, Frederick F. (1993) Epitaxial Grain Growth in Thin Films. Materials Science Forum, 113. 81-90 doi:10.4028/www.scientific.net/msf.113-115.81
Bohn, H.G., Su, C.M. (1993) Investigation of the Influence of Impurities on the Grain Boundary Relaxation in Thin Al-Films on Si-Substrates. Materials Science Forum, 119. 273-278 doi:10.4028/www.scientific.net/msf.119-121.273
Gerth, D., Schwarzer, Robert A. (1994) Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations. Materials Science Forum, 157. 1571-1576 doi:10.4028/www.scientific.net/msf.157-162.1571
Böcker, A., Bunge, Hans Joachim, Ernst, Johannes, Krahn, W. (1993) Texture Evolution in Al2O3 Sheets by Grain Growth during Sintering. Materials Science Forum, 113. 575-578 doi:10.4028/www.scientific.net/msf.113-115.575
Harase, J., Tomimasu, K., Nakashima, S., Nagashima, T., Takashima, K., Yoshitomi, Y., Takahashi, N. (1993) Preferred Orientations Formed by Grain Growth and Primary Recrystallization Grain Sizes in Fe-3%Si. Materials Science Forum, 113. 709-714 doi:10.4028/www.scientific.net/msf.113-115.709
 
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