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Wang, J.S., Zheng, X.J., Zheng, H., Song, S.T., Zhu, Z. (2010) Identification of elastic parameters of transversely isotropic thin films by combining nanoindentation and FEM analysis. Computational Materials Science, 49 (2). 378-385 doi:10.1016/j.commatsci.2010.05.025

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Reference TypeJournal (article/letter/editorial)
TitleIdentification of elastic parameters of transversely isotropic thin films by combining nanoindentation and FEM analysis
JournalComputational Materials Science
AuthorsWang, J.S.Author
Zheng, X.J.Author
Zheng, H.Author
Song, S.T.Author
Zhu, Z.Author
Year2010 (August)Volume49
Issue2
PublisherElsevier BV
DOIdoi:10.1016/j.commatsci.2010.05.025Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9506033Long-form Identifiermindat:1:5:9506033:0
GUID0
Full ReferenceWang, J.S., Zheng, X.J., Zheng, H., Song, S.T., Zhu, Z. (2010) Identification of elastic parameters of transversely isotropic thin films by combining nanoindentation and FEM analysis. Computational Materials Science, 49 (2). 378-385 doi:10.1016/j.commatsci.2010.05.025
Plain TextWang, J.S., Zheng, X.J., Zheng, H., Song, S.T., Zhu, Z. (2010) Identification of elastic parameters of transversely isotropic thin films by combining nanoindentation and FEM analysis. Computational Materials Science, 49 (2). 378-385 doi:10.1016/j.commatsci.2010.05.025
In(2010, August) Computational Materials Science Vol. 49 (2) Elsevier BV

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