Talwar, Devki N., Feng, Z.C. (2004) Understanding spectroscopic phonon-assisted defect features in CVD grown 3C-SiC/Si(100) by modeling and simulation. Computational Materials Science, 30 (3). 419-424 doi:10.1016/j.commatsci.2004.02.035
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Understanding spectroscopic phonon-assisted defect features in CVD grown 3C-SiC/Si(100) by modeling and simulation | ||
| Journal | Computational Materials Science | ||
| Authors | Talwar, Devki N. | Author | |
| Feng, Z.C. | Author | ||
| Year | 2004 (August) | Volume | 30 |
| Issue | 3 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.commatsci.2004.02.035Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9503933 | Long-form Identifier | mindat:1:5:9503933:0 |
| GUID | 0 | ||
| Full Reference | Talwar, Devki N., Feng, Z.C. (2004) Understanding spectroscopic phonon-assisted defect features in CVD grown 3C-SiC/Si(100) by modeling and simulation. Computational Materials Science, 30 (3). 419-424 doi:10.1016/j.commatsci.2004.02.035 | ||
| Plain Text | Talwar, Devki N., Feng, Z.C. (2004) Understanding spectroscopic phonon-assisted defect features in CVD grown 3C-SiC/Si(100) by modeling and simulation. Computational Materials Science, 30 (3). 419-424 doi:10.1016/j.commatsci.2004.02.035 | ||
| In | (2004, August) Computational Materials Science Vol. 30 (3) Elsevier BV | ||
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