| Reference Type | Journal (article/letter/editorial) |
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| Title | A creep finite element analysis of indentation creep testing in two phase microstructures (particle/matrix- and thin film/substrate-systems) |
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| Journal | Computational Materials Science |
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| Authors | Yue, Z.F | Author |
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| Eggeler, G | Author |
| Stöckhert, B | Author |
| Year | 2001 (May) | Volume | 21 |
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| Issue | 1 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/s0927-0256(00)00214-7Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 9503364 | Long-form Identifier | mindat:1:5:9503364:6 |
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| GUID | 0 |
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| Full Reference | Yue, Z.F, Eggeler, G, Stöckhert, B (2001) A creep finite element analysis of indentation creep testing in two phase microstructures (particle/matrix- and thin film/substrate-systems). Computational Materials Science, 21 (1). 37-56 doi:10.1016/s0927-0256(00)00214-7 |
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| Plain Text | Yue, Z.F, Eggeler, G, Stöckhert, B (2001) A creep finite element analysis of indentation creep testing in two phase microstructures (particle/matrix- and thin film/substrate-systems). Computational Materials Science, 21 (1). 37-56 doi:10.1016/s0927-0256(00)00214-7 |
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| In | (2001, May) Computational Materials Science Vol. 21 (1) Elsevier BV |
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