Kim, Yun-Hae, Kim, Do-Wan, Murakami, Ri-Ichi, Zhang, Dongyan, Yoon, Sung-Won, Park, Se-Ho, Moon, Kyung-Man (2011) The Study of Transmittance and Conductivity by Top ZnO Thickness in ZnO/Ag/ZnO Transparent Conducting Oxide Films. Advanced Science Letters, 4 (4). 1570-1573 doi:10.1166/asl.2011.1681
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | The Study of Transmittance and Conductivity by Top ZnO Thickness in ZnO/Ag/ZnO Transparent Conducting Oxide Films | ||
| Journal | Advanced Science Letters | ||
| Authors | Kim, Yun-Hae | Author | |
| Kim, Do-Wan | Author | ||
| Murakami, Ri-Ichi | Author | ||
| Zhang, Dongyan | Author | ||
| Yoon, Sung-Won | Author | ||
| Park, Se-Ho | Author | ||
| Moon, Kyung-Man | Author | ||
| Year | 2011 (April 1) | Volume | 4 |
| Issue | 4 | ||
| Publisher | American Scientific Publishers | ||
| DOI | doi:10.1166/asl.2011.1681Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 9201440 | Long-form Identifier | mindat:1:5:9201440:0 |
| GUID | 0 | ||
| Full Reference | Kim, Yun-Hae, Kim, Do-Wan, Murakami, Ri-Ichi, Zhang, Dongyan, Yoon, Sung-Won, Park, Se-Ho, Moon, Kyung-Man (2011) The Study of Transmittance and Conductivity by Top ZnO Thickness in ZnO/Ag/ZnO Transparent Conducting Oxide Films. Advanced Science Letters, 4 (4). 1570-1573 doi:10.1166/asl.2011.1681 | ||
| Plain Text | Kim, Yun-Hae, Kim, Do-Wan, Murakami, Ri-Ichi, Zhang, Dongyan, Yoon, Sung-Won, Park, Se-Ho, Moon, Kyung-Man (2011) The Study of Transmittance and Conductivity by Top ZnO Thickness in ZnO/Ag/ZnO Transparent Conducting Oxide Films. Advanced Science Letters, 4 (4). 1570-1573 doi:10.1166/asl.2011.1681 | ||
| In | (2011, April) Advanced Science Letters Vol. 4 (4) American Scientific Publishers | ||
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