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Liebig, Alexander, Giessibl, Franz J. (2019) In-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy. Applied Physics Letters, 114 (14). 143103pp. doi:10.1063/1.5085747

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Reference TypeJournal (article/letter/editorial)
TitleIn-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy
JournalApplied Physics Letters
AuthorsLiebig, AlexanderAuthor
Giessibl, Franz J.Author
Year2019 (April 8)Volume114
Issue14
PublisherAIP Publishing
DOIdoi:10.1063/1.5085747Search in ResearchGate
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Mindat Ref. ID8656189Long-form Identifiermindat:1:5:8656189:1
GUID0
Full ReferenceLiebig, Alexander, Giessibl, Franz J. (2019) In-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy. Applied Physics Letters, 114 (14). 143103pp. doi:10.1063/1.5085747
Plain TextLiebig, Alexander, Giessibl, Franz J. (2019) In-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy. Applied Physics Letters, 114 (14). 143103pp. doi:10.1063/1.5085747
In(2019, April) Applied Physics Letters Vol. 114 (14) AIP Publishing

See Also

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Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters, 76 (11). 1470-1472 doi:10.1063/1.126067
Giessibl, Franz J., Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Applied Physics Letters, 70 (19). 2529-2531 doi:10.1063/1.118910
Liebig, A, Peronio, A, Meuer, D, Weymouth, A J, Giessibl, F J (2020) High-precision atomic force microscopy with atomically-characterized tips. New Journal of Physics, 22 (6) 63040pp. doi:10.1088/1367-2630/ab8efd
Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters, 73 (26). 3956-3958 doi:10.1063/1.122948
Ooe, Hiroaki, Kirpal, Dominik, Wastl, Daniel S., Weymouth, Alfred J., Arai, Toyoko, Giessibl, Franz J. (2016) Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy. Applied Physics Letters, 109 (14). 141603pp. doi:10.1063/1.4964125
Yurtsever, Ayhan, Gigler, Alexander M., Dietz, Christian, Stark, Robert W. (2008) Frequency modulated torsional resonance mode atomic force microscopy on polymers. Applied Physics Letters, 92 (14). 143103pp. doi:10.1063/1.2907498
Berwanger, Julian, Huber, Ferdinand, Stilp, Fabian, Giessibl, Franz J. (2018) Lateral manipulation of single iron adatoms by means of combined atomic force and scanning tunneling microscopy using CO-terminated tips. Physical Review B, 98 (19) doi:10.1103/physrevb.98.195409
Tung, Ryan C., Wutscher, Thorsten, Martinez-Martin, David, Reifenberger, Ronald G., Giessibl, Franz, Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. Journal of Applied Physics, 107 (10). 104508pp. doi:10.1063/1.3407511
Giessibl, Franz J. (1999) Erratum: “High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork” [Appl. Phys. Lett. 73, 3956 (1998)]. Applied Physics Letters, 74 (26). 4070 doi:10.1063/1.123265
Mohn, Fabian, Schuler, Bruno, Gross, Leo, Meyer, Gerhard (2013) Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules. Applied Physics Letters, 102 (7). 73109pp. doi:10.1063/1.4793200
Giessibl, Franz J., Quate, Calvin F. (2006) Exploring the nanoworld with atomic force microscopy. Physics Today, 59. 44-50 doi:10.1063/1.2435681
 
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