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Mahadik, Nadeemullah A., Qadri, Syed B., Rao, Mulpuri V. (2008) In situ strain measurements on GaN/AlGaN Schottky diodes with variable bias. Applied Physics Letters, 93 (26). 262106pp. doi:10.1063/1.3063125

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Reference TypeJournal (article/letter/editorial)
TitleIn situ strain measurements on GaN/AlGaN Schottky diodes with variable bias
JournalApplied Physics Letters
AuthorsMahadik, Nadeemullah A.Author
Qadri, Syed B.Author
Rao, Mulpuri V.Author
Year2008 (December 29)Volume93
Issue26
PublisherAIP Publishing
DOIdoi:10.1063/1.3063125Search in ResearchGate
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Mindat Ref. ID8570408Long-form Identifiermindat:1:5:8570408:2
GUID0
Full ReferenceMahadik, Nadeemullah A., Qadri, Syed B., Rao, Mulpuri V. (2008) In situ strain measurements on GaN/AlGaN Schottky diodes with variable bias. Applied Physics Letters, 93 (26). 262106pp. doi:10.1063/1.3063125
Plain TextMahadik, Nadeemullah A., Qadri, Syed B., Rao, Mulpuri V. (2008) In situ strain measurements on GaN/AlGaN Schottky diodes with variable bias. Applied Physics Letters, 93 (26). 262106pp. doi:10.1063/1.3063125
In(2008, December) Applied Physics Letters Vol. 93 (26) AIP Publishing

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