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Zhang, Z. Q., He, W. Q., Gu, C. M., Shen, W. Z., Ogawa, H., Guo, Q. X. (2007) Determination of the third- and fifth-order nonlinear refractive indices in InN thin films. Applied Physics Letters, 91 (22). 221902pp. doi:10.1063/1.2813637

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of the third- and fifth-order nonlinear refractive indices in InN thin films
JournalApplied Physics Letters
AuthorsZhang, Z. Q.Author
He, W. Q.Author
Gu, C. M.Author
Shen, W. Z.Author
Ogawa, H.Author
Guo, Q. X.Author
Year2007 (November 26)Volume91
Issue22
PublisherAIP Publishing
DOIdoi:10.1063/1.2813637Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8557965Long-form Identifiermindat:1:5:8557965:3
GUID0
Full ReferenceZhang, Z. Q., He, W. Q., Gu, C. M., Shen, W. Z., Ogawa, H., Guo, Q. X. (2007) Determination of the third- and fifth-order nonlinear refractive indices in InN thin films. Applied Physics Letters, 91 (22). 221902pp. doi:10.1063/1.2813637
Plain TextZhang, Z. Q., He, W. Q., Gu, C. M., Shen, W. Z., Ogawa, H., Guo, Q. X. (2007) Determination of the third- and fifth-order nonlinear refractive indices in InN thin films. Applied Physics Letters, 91 (22). 221902pp. doi:10.1063/1.2813637
In(2007, November) Applied Physics Letters Vol. 91 (22) AIP Publishing

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Zhou, H. P., Shen, W. Z., Ogawa, H., Guo, Q. X. (2004) Temperature dependence of refractive index in InN thin films grown by reactive sputtering. Journal of Applied Physics, 96 (6). 3199-3205 doi:10.1063/1.1782955
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Wu, S., Ren, Z. Q., Shen, W. Z., Ogawa, H., Guo, Q. X. (2003) Effects of dry etching processes on effective refractive index of ZnTe surface layers in terahertz region. Journal of Applied Physics, 94 (6). 3800-3804 doi:10.1063/1.1602568
Zhang, Q., Wang, X. Q., He, X. W., Yin, C. M., Xu, F. J., Shen, B., Chen, Y. H., Wang, Z. G., Ishitani, Y., Yoshikawa, A. (2009) Lattice polarity detection of InN by circular photogalvanic effect. Applied Physics Letters, 95 (3). 31902pp. doi:10.1063/1.3186042
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