Chen, Dye-Zone A., Chen, Gang (2007) Measurement of silicon dioxide surface phonon-polariton propagation length by attenuated total reflection. Applied Physics Letters, 91 (12). 121906pp. doi:10.1063/1.2789177
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Measurement of silicon dioxide surface phonon-polariton propagation length by attenuated total reflection | ||
| Journal | Applied Physics Letters | ||
| Authors | Chen, Dye-Zone A. | Author | |
| Chen, Gang | Author | ||
| Year | 2007 (September 17) | Volume | 91 |
| Issue | 12 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2789177Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8556058 | Long-form Identifier | mindat:1:5:8556058:5 |
| GUID | 0 | ||
| Full Reference | Chen, Dye-Zone A., Chen, Gang (2007) Measurement of silicon dioxide surface phonon-polariton propagation length by attenuated total reflection. Applied Physics Letters, 91 (12). 121906pp. doi:10.1063/1.2789177 | ||
| Plain Text | Chen, Dye-Zone A., Chen, Gang (2007) Measurement of silicon dioxide surface phonon-polariton propagation length by attenuated total reflection. Applied Physics Letters, 91 (12). 121906pp. doi:10.1063/1.2789177 | ||
| In | (2007, September) Applied Physics Letters Vol. 91 (12) AIP Publishing | ||
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