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Ong, Y. C., Ang, D. S., Pey, K. L., O’Shea, S. J., Goh, K. E. J., Troadec, C., Tung, C. H., Kawanago, T., Kakushima, K., Iwai, H. (2007) Bilayer gate dielectric study by scanning tunneling microscopy. Applied Physics Letters, 91 (10). 102905pp. doi:10.1063/1.2780084

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Reference TypeJournal (article/letter/editorial)
TitleBilayer gate dielectric study by scanning tunneling microscopy
JournalApplied Physics Letters
AuthorsOng, Y. C.Author
Ang, D. S.Author
Pey, K. L.Author
O’Shea, S. J.Author
Goh, K. E. J.Author
Troadec, C.Author
Tung, C. H.Author
Kawanago, T.Author
Kakushima, K.Author
Iwai, H.Author
Year2007 (September 3)Volume91
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.2780084Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8555815Long-form Identifiermindat:1:5:8555815:5
GUID0
Full ReferenceOng, Y. C., Ang, D. S., Pey, K. L., O’Shea, S. J., Goh, K. E. J., Troadec, C., Tung, C. H., Kawanago, T., Kakushima, K., Iwai, H. (2007) Bilayer gate dielectric study by scanning tunneling microscopy. Applied Physics Letters, 91 (10). 102905pp. doi:10.1063/1.2780084
Plain TextOng, Y. C., Ang, D. S., Pey, K. L., O’Shea, S. J., Goh, K. E. J., Troadec, C., Tung, C. H., Kawanago, T., Kakushima, K., Iwai, H. (2007) Bilayer gate dielectric study by scanning tunneling microscopy. Applied Physics Letters, 91 (10). 102905pp. doi:10.1063/1.2780084
In(2007, September) Applied Physics Letters Vol. 91 (10) AIP Publishing

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