| Reference Type | Journal (article/letter/editorial) |
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| Title | Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes |
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| Journal | Applied Physics Letters |
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| Authors | Chen, Ying | Author |
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| Chen, Hua | Author |
| Yu, Jun | Author |
| Williams, James S. | Author |
| Craig, Vince | Author |
| Year | 2007 (February 26) | Volume | 90 |
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| Issue | 9 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.2710785Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 8555636 | Long-form Identifier | mindat:1:5:8555636:0 |
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|
| GUID | 0 |
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| Full Reference | Chen, Ying, Chen, Hua, Yu, Jun, Williams, James S., Craig, Vince (2007) Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes. Applied Physics Letters, 90 (9). 93126pp. doi:10.1063/1.2710785 |
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| Plain Text | Chen, Ying, Chen, Hua, Yu, Jun, Williams, James S., Craig, Vince (2007) Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes. Applied Physics Letters, 90 (9). 93126pp. doi:10.1063/1.2710785 |
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| In | (2007, February) Applied Physics Letters Vol. 90 (9) AIP Publishing |
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