登录注册
Quick Links : Mindat手册The Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
主页关于 MindatMindat手册Mindat的历史版权Who We Are联系我们于 Mindat.org刊登广告
捐赠给 MindatCorporate Sponsorship赞助板页已赞助的板页在 Mindat刊登 广告的广告商于 Mindat.org刊登广告
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
搜索矿物的性质搜索矿物的化学Mineral Visual ExplorerAdvanced Locality Search随意显示任何一 种矿物Random Locality使用minID搜索邻近产地Search Articles搜索词汇表更多搜索选项
搜索:
矿物名称:
地区产地名称:
关键字:
 
Mindat手册添加新照片Rate Photos产区编辑报告Coordinate Completion Report添加词汇表项目
Mining Companies统计会员列表Mineral MuseumsClubs & Organizations矿物展及活动The Mindat目录表设备设置The Mineral QuizTime Machine
照片搜索Photo GalleriesSearch by ColorPhoto Colour Explorer今天最新的照片昨天最新的照片用户照片相集过去每日精选照片相集Photography

Tessier, G., Bardoux, M., Boué, C., Filloy, C., Fournier, D. (2007) Back side thermal imaging of integrated circuits at high spatial resolution. Applied Physics Letters, 90 (17). 171112pp. doi:10.1063/1.2732179

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleBack side thermal imaging of integrated circuits at high spatial resolution
JournalApplied Physics Letters
AuthorsTessier, G.Author
Bardoux, M.Author
Boué, C.Author
Filloy, C.Author
Fournier, D.Author
Year2007 (April 23)Volume90
Issue17
PublisherAIP Publishing
DOIdoi:10.1063/1.2732179Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8553675Long-form Identifiermindat:1:5:8553675:5
GUID0
Full ReferenceTessier, G., Bardoux, M., Boué, C., Filloy, C., Fournier, D. (2007) Back side thermal imaging of integrated circuits at high spatial resolution. Applied Physics Letters, 90 (17). 171112pp. doi:10.1063/1.2732179
Plain TextTessier, G., Bardoux, M., Boué, C., Filloy, C., Fournier, D. (2007) Back side thermal imaging of integrated circuits at high spatial resolution. Applied Physics Letters, 90 (17). 171112pp. doi:10.1063/1.2732179
In(2007, April) Applied Physics Letters Vol. 90 (17) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Tessier, G, Polignano, M-L, Pavageau, S, Filloy, C, Fournier, D, Cerutti, F, Mica, I (2006) Thermoreflectance temperature imaging of integrated circuits: calibration technique and quantitative comparison with integrated sensors and simulations. Journal of Physics D: Applied Physics, 39. 4159-4166 doi:10.1088/0022-3727/39/19/007
Tessier, G., Holé, S., Fournier, D. (2001) Quantitative thermal imaging by synchronous thermoreflectance with optimized illumination wavelengths. Applied Physics Letters, 78 (16). 2267-2269 doi:10.1063/1.1363696
Tessier, G., Jerosolimski, G., Holé, S., Fournier, D., Filloy, C. (2003) Measuring and predicting the thermoreflectance sensitivity as a function of wavelength on encapsulated materials. Review of Scientific Instruments, 74 (1). 495-499 doi:10.1063/1.1517153
Gelinck, G. H., Geuns, T. C. T., de Leeuw, D. M. (2000) High-performance all-polymer integrated circuits. Applied Physics Letters, 77 (10). 1487-1489 doi:10.1063/1.1290728
Auld, B. A., Drake, M. E., Roberts, C. G. (1974) Monolithic acoustic imaging transducer structures with high spatial resolution. Applied Physics Letters, 25 (9). 478-479 doi:10.1063/1.1655555
Suck, S. Y., Tessier, G., Warnasooriya, N., Babuty, A., De Wilde, Y. (2010) Frequency-resolved temperature imaging of integrated circuits with full field heterodyne interferometry. Applied Physics Letters, 96 (12). 121108pp. doi:10.1063/1.3367738
Aigouy, Lionel, Tessier, Gilles, Mortier, Michel, Charlot, Benoît (2005) Scanning thermal imaging of microelectronic circuits with a fluorescent nanoprobe. Applied Physics Letters, 87 (18). 184105pp. doi:10.1063/1.2123384
Lagowski, J., Gatos, H. C., Kang, C. H., Skowronski, M., Ko, K. Y., Lin, D. G. (1986) Inverted thermal conversion—GaAs, a new alternative material for integrated circuits. Applied Physics Letters, 49 (14). 892-894 doi:10.1063/1.97527
Bruzzi, M., Bucciolini, M., Casati, M., Menichelli, D., Talamonti, C., Piemonte, C., Svensson, B. G. (2007) Epitaxial silicon devices for dosimetry applications. Applied Physics Letters, 90 (17). 172109pp. doi:10.1063/1.2723075
Stillman, G. E., Wolfe, C. M., Rossi, J. A., Heckscher, H. (1976) Low‐loss high‐purity GaAs waveguides for monolithic integrated optical circuits at GaAs laser wavelengths. Applied Physics Letters, 28 (4). 197-199 doi:10.1063/1.88694
Daykin, A. C., Jakubovics, J. P. (1996) Magnetization imaging at high spatial resolution using transmission electron microscopy. Journal of Applied Physics, 80 (6). 3408-3411 doi:10.1063/1.363207
 
and/or  
版权所有© mindat.org1993年至2026年，除了规定的地方。 Mindat.org全赖于全球数千个以上成员和支持者们的参与。
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
隐私政策 - 条款和条款细则 - 联络我们 - Report a bug/vulnerability Current server date and time: 2026.6.6 16:36:33
Go to top of page