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Ramspeck, K., Bothe, K., Hinken, D., Fischer, B., Schmidt, J., Brendel, R. (2007) Recombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography. Applied Physics Letters, 90 (15). 153502pp. doi:10.1063/1.2721138

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Reference TypeJournal (article/letter/editorial)
TitleRecombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography
JournalApplied Physics Letters
AuthorsRamspeck, K.Author
Bothe, K.Author
Hinken, D.Author
Fischer, B.Author
Schmidt, J.Author
Brendel, R.Author
Year2007 (April 9)Volume90
Issue15
PublisherAIP Publishing
DOIdoi:10.1063/1.2721138Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8553354Long-form Identifiermindat:1:5:8553354:5
GUID0
Full ReferenceRamspeck, K., Bothe, K., Hinken, D., Fischer, B., Schmidt, J., Brendel, R. (2007) Recombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography. Applied Physics Letters, 90 (15). 153502pp. doi:10.1063/1.2721138
Plain TextRamspeck, K., Bothe, K., Hinken, D., Fischer, B., Schmidt, J., Brendel, R. (2007) Recombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography. Applied Physics Letters, 90 (15). 153502pp. doi:10.1063/1.2721138
In(2007, April) Applied Physics Letters Vol. 90 (15) AIP Publishing

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Hinken, David, Ramspeck, Klaus, Bothe, Karsten, Fischer, Bernhard, Brendel, Rolf (2007) Series resistance imaging of solar cells by voltage dependent electroluminescence. Applied Physics Letters, 91 (18). 182104pp. doi:10.1063/1.2804562
Bothe, K., Ramspeck, K., Hinken, D., Schinke, C., Schmidt, J., Herlufsen, S., Brendel, R., Bauer, J., Wagner, J.-M., Zakharov, N., Breitenstein, O. (2009) Luminescence emission from forward- and reverse-biased multicrystalline silicon solar cells. Journal of Applied Physics, 106 (10). 104510pp. doi:10.1063/1.3256199
Ramspeck, K., Reissenweber, S., Schmidt, J., Bothe, K., Brendel, R. (2008) Dynamic carrier lifetime imaging of silicon wafers using an infrared-camera-based approach. Applied Physics Letters, 93 (10). 102104pp. doi:10.1063/1.2972122
Hinken, David, Bothe, Karsten, Ramspeck, Klaus, Herlufsen, Sandra, Brendel, Rolf (2009) Determination of the effective diffusion length of silicon solar cells from photoluminescence. Journal of Applied Physics, 105 (10). 104516pp. doi:10.1063/1.3130408
Ramspeck, Klaus, Bothe, Karsten, Schmidt, Jan, Brendel, Rolf (2009) Combined dynamic and steady-state infrared camera based carrier lifetime imaging of silicon wafers. Journal of Applied Physics, 106 (11). 114506pp. doi:10.1063/1.3261733
Hinken, David, Schinke, Carsten, Herlufsen, Sandra, Schmidt, Arne, Bothe, Karsten, Brendel, Rolf (2011) Experimental setup for camera-based measurements of electrically and optically stimulated luminescence of silicon solar cells and wafers. Review of Scientific Instruments, 82 (3). 33706pp. doi:10.1063/1.3541766
Hinken, D, Kröger, I, Winter, S, Brendel, R, Bothe, K (2019) Determining the spectral responsivity of solar cells under standard test conditions. Measurement Science and Technology, 30. 125008pp. doi:10.1088/1361-6501/ab34ef
Trupke, T., Pink, E., Bardos, R. A., Abbott, M. D. (2007) Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging. Applied Physics Letters, 90 (9). 93506pp. doi:10.1063/1.2709630
Kasemann, Martin, Schubert, Martin C., The, Manuel, Köber, Mariana, Hermle, Martin, Warta, Wilhelm (2006) Comparison of luminescence imaging and illuminated lock-in thermography on silicon solar cells. Applied Physics Letters, 89 (22). 224102pp. doi:10.1063/1.2399346
Pohl, Peter, Schmidt, Jan, Bothe, Karsten, Brendel, Rolf (2005) Mapping of trap densities and energy levels in semiconductors using a lock-in infrared camera technique. Applied Physics Letters, 87 (14). 142104pp. doi:10.1063/1.2077833
Pohl, Peter, Brendel, Rolf (2005) Infrared capacity mapping of semiconductor junctions by lock-in thermography. Applied Physics Letters, 87 (3). 32104pp. doi:10.1063/1.1999010
 
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