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Dwyer, Christian, Kirkland, Angus I., Hartel, Peter, Müller, Heiko, Haider, Maximilian (2007) Electron nanodiffraction using sharply focused parallel probes. Applied Physics Letters, 90 (15). 151104pp. doi:10.1063/1.2721120

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Reference TypeJournal (article/letter/editorial)
TitleElectron nanodiffraction using sharply focused parallel probes
JournalApplied Physics Letters
AuthorsDwyer, ChristianAuthor
Kirkland, Angus I.Author
Hartel, PeterAuthor
Müller, HeikoAuthor
Haider, MaximilianAuthor
Year2007 (April 9)Volume90
Issue15
PublisherAIP Publishing
DOIdoi:10.1063/1.2721120Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8553343Long-form Identifiermindat:1:5:8553343:9
GUID0
Full ReferenceDwyer, Christian, Kirkland, Angus I., Hartel, Peter, Müller, Heiko, Haider, Maximilian (2007) Electron nanodiffraction using sharply focused parallel probes. Applied Physics Letters, 90 (15). 151104pp. doi:10.1063/1.2721120
Plain TextDwyer, Christian, Kirkland, Angus I., Hartel, Peter, Müller, Heiko, Haider, Maximilian (2007) Electron nanodiffraction using sharply focused parallel probes. Applied Physics Letters, 90 (15). 151104pp. doi:10.1063/1.2721120
In(2007, April) Applied Physics Letters Vol. 90 (15) AIP Publishing

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Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Haider, Maximilian (2006) Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 12 (6). 442-455 doi:10.1017/s1431927606060600
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Haider, Maximilian (2008) Aberration-corrected optics: from an idea to a device. Physics Procedia, 1. 167-178 doi:10.1016/j.phpro.2008.07.093
Dwyer, C, Hartel, P, Muller, H, Haider, M, Kirkland, AI (2007) Uses of a STEM Cs-Corrector in Electron Diffractive Imaging. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607073989
Uhlemann, Stephan, Müller, Heiko, Hartel, Peter, Zach, Joachim, Haider, Max. (2013) Thermal Magnetic Field Noise Limits Resolution in Transmission Electron Microscopy. Physical Review Letters, 111 (4). doi:10.1103/physrevlett.111.046101
Müller, Heiko, Maßmann, Ingo, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Maximilian (2011) Aplanatic imaging systems for the transmission electron microscope. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 645 (1). 20-27 doi:10.1016/j.nima.2010.12.091
Börrnert, Felix, Biskupek, Johannes, Lee, Zhongbo, Linck, Martin, Hartel, Peter, Müller, Heiko, Haider, Maximilian, Kaiser, Ute A. (2016) Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kV SALVE Microscope. Microscopy and Microanalysis, 22. 880-881 doi:10.1017/s1431927616005249
Schultz, Moty, Klein, Lior (2007) Relaxation of transport properties in electron-doped SrTiO3. Applied Physics Letters, 91 (15). 151104pp. doi:10.1063/1.2795336
Sawada, Hidetaka, Tomita, Takeshi, Naruse, Mikio, Honda, Toshikazu, Hambridge, Paul, Hartel, Peter, Haider, Maximilian, Hetherington, Crispin, Doole, Ron, Kirkland, Angus, Hutchison, John, Titchmarsh, John, Cockayne, David (2005) Experimental evaluation of a spherical aberration-corrected TEM and STEM. Microscopy, 54 (2). 119-121 doi:10.1093/jmicro/dfi001
Hartel, Peter, Linck, Martin, Kahl, Frank, Müller, Heiko, Haider, Max (2014) On Proper Phase Contrast Imaging in Aberration Corrected TEM. Microscopy and Microanalysis, 20. 926-927 doi:10.1017/s1431927614006357
Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Max (2014) Overview of Commercially Available CEOS Hexapole-type Aberration Correctors. Microscopy and Microanalysis, 20. 934-935 doi:10.1017/s1431927614006394
Hashimoto, Ayako, Wang, Peng, Shimojo, Masayuki, Mitsuishi, Kazutaka, Nellist, Peter D., Kirkland, Angus I., Takeguchi, Masaki (2012) Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy. Applied Physics Letters, 101 (25). 253108pp. doi:10.1063/1.4772514
 
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